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ORCIDFabian Vargas 0001
Fabian Luis Vargas 0001
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- affiliation: Pontifical Catholic University of Rio Grande do Sul, Porto Alegre, Brazil
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2020 – today
- 2024
[j32]Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. J. Electron. Test. 40(1): 75-86 (2024)- [c101]Fabian Luis Vargas:
On-Chip Cross-Layer Infrastructure to Leverage System Reliability for Aero-Space Applications: Embedded Tutorial. DDECS 2024: 116-117 - [c100]Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yervant Zorian:
On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. IOLTS 2024: 1-6 - [c99]Diana Göhringer, Ariel Podlubne, Fabian Vargas, Milos Krstic:
Self-Aware Reliable and Reconfigurable Computing Systems - An Overview. IPDPS (Workshops) 2024: 124-129 - [c98]Junchao Chen, Li Lu, Marko S. Andjelkovic, Fabian Luis Vargas, Milos Krstic:
Space Radiation Flux Driven Fault Injection for Evaluating Dynamic Mitigation Strategies. LATS 2024: 1-6 - [c97]Rizwan Tariq Syed, Fabian Vargas, Marko S. Andjelkovic, Markus Ulbricht, Milos Krstic:
Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor. LATS 2024: 1-6 - [c96]Fabian Vargas, Milos Krstic, Marko S. Andjelkovic, Markus Ulbricht, Junchao Chen:
Silicon Lifecycle Management Based on On-Chip Cross-Layer Sensing and Analytics for Space Applications. LATS 2024: 1-6 - [c95]Jianan Wen
, Fabian Luis Vargas, Fukun Zhu, Daniel Reiser, Andrea Baroni, Markus Fritscher, Eduardo Pérez, Marc Reichenbach, Christian Wenger, Milos Krstic:
Cycle-Accurate FPGA Emulation of RRAM Crossbar Array: Efficient Device and Variability Modeling with Energy Consumption Assessment. LATS 2024: 1-6 - [c94]Fabian Luis Vargas:
On-Chip Infrastructure for Mission-Mode Monitoring of Aero-Space Applications: Towards Silicon Lifecycle Management; Embedded Tutorial. MIXDES 2024: 17-18 - 2023
- [c93]Nicolas Gerlin, Endri Kaja, Fabian Vargas, Li Lu, Anselm Breitenreiter, Junchao Chen, Markus Ulbricht, Maribel Gomez, Ares Tahiraga, Sebastian Prebeck, Eyck Jentzsch, Milos Krstic, Wolfgang Ecker:
Bits, Flips and RISCs. DDECS 2023: 140-149 - [c92]Junchao Chen, Marko S. Andjelkovic, Milos Krstic, Fabian Luis Vargas:
A Machine Learning-driven EDAC Method for Space-Application Memory. DFT 2023: 1-6 - [c91]Marko S. Andjelkovic, Junchao Chen, Rizwan Tariq Syed, Fabian Vargas, Markus Ulbricht, Milos Krstic, Stefan D. Ilic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic, Goran S. Ristic, Russell Duane, Nikola Vasovic, Aleksandar Jaksic, Alberto J. Palma, Antonio M. Lallena, Miguel Ángel Carvajal:
Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System. DSD 2023: 286-293 - [c90]Fabian Vargas, Douglas Borba, Juliano Benfica, Rizwan Tariq Syed:
Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power Lines. IOLTS 2023: 1-6 - 2022
- [c89]Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. LATS 2022: 1-6 - 2021
- [j31]Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas:
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell. J. Electron. Test. 37(3): 369-382 (2021) - [c88]E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani:
Evaluating the Impact of Process Variation on RRAMs. LATS 2021: 1-6 - 2020
- [j30]David C. C. Freitas, David F. M. Mota, Roger C. Goerl, César A. M. Marcon, Fabian Vargas, Jarbas A. N. Silveira, João Cesar M. Mota:
PCoSA: A product error correction code for use in memory devices targeting space applications. Integr. 74: 71-80 (2020) - [c87]Raphael Segabinazzi Ferreira, Jörg Nolte, Fabian Vargas, Nevin George, Michael Hübner:
Run-time Hardware Reconfiguration of Functional Units to Support Mixed-Critical Applications. LATS 2020: 1-6 - [c86]Zahira Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac:
Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells. LATS 2020: 1-6
2010 – 2019
- 2019
- [j29]Paulo Ricardo Cechelero Villa, Rodrigo Travessini, Roger C. Goerl, Fabian Luis Vargas, Eduardo Augusto Bezerra:
Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy. J. Electron. Test. 35(1): 9-27 (2019) - [c85]Estevan Lara, Guilherme Debon, Roger C. Goerl, Paulo Ricardo Cechelero Villa, Dorian Schramm, Leticia B. Poehls, Fabian Vargas:
A New Approach to Guarantee Critical Task Schedulability in TDMA-Based Bus Access of Multicore Architecture. LATS 2019: 1-6 - [c84]Cezar Antônio Rigo, Lucas M. Luza, Elder Dominghini Tramontin, Victor M. Goncalves Martins, Sara Vega Martínez, Leonardo Kessler Slongo, Laio Oriel Seman, Luigi Dilillo, Fabian Luis Vargas, Eduardo A. Bezerra:
A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites. LATS 2019: 1-6 - 2018
- [j28]Felipe G. A. e Silva, Jardel Silveira, Jarbas Silveira, César A. M. Marcon, Fabian Vargas, Otávio Alcântara de Lima Jr.:
An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays. J. Electron. Test. 34(4): 417-433 (2018) - [j27]Roger C. Goerl, Paulo Ricardo Cechelero Villa, Letícia Maria Veiras Bolzani, Eduardo Augusto Bezerra, Fabian Luis Vargas:
An efficient EDAC approach for handling multiple bit upsets in memory array. Microelectron. Reliab. 88-90: 214-218 (2018) - [j26]G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui:
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. 88-90: 355-359 (2018) - [c83]F. Tubiello, Leticia Bolzani Poehls, Thais Webber, César Augusto Missio Marcon, Fabian Vargas:
A path energy control technique for energy efficiency on wireless sensor networks. LASCAS 2018: 1-4 - [c82]George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls:
A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects. LATS 2018: 1-6 - [c81]Renato Severo, Celso Maciel da Costa, Adriane Parraga, Debora Motta, Ivan Müller, Fabian Vargas:
Design and test of the RT-NKE task scheduling algorithm for multicore architectures. LATS 2018: 1-6 - [c80]Rodrigo Travessini, Paulo Ricardo Cechelero Villa, Fabian Luis Vargas, Eduardo Augusto Bezerra:
Processor core profiling for SEU effect analysis. LATS 2018: 1-6 - [c79]Paulo Ricardo Cechelero Villa, Rodrigo Travessini, Fabian Luis Vargas, Eduardo Augusto Bezerra:
Processor checkpoint recovery for transient faults in critical applications. LATS 2018: 1-6 - 2017
- [j25]M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls:
Analysing NBTI Impact on SRAMs with Resistive Defects. J. Electron. Test. 33(5): 637-655 (2017) - [c78]Felipe G. H. Leite, Roberto B. B. Santos, Nilberto H. Medina, Vitor A. P. Aguiar, Renato C. Giacomini, Nemitala Added, Fernando Aguirre, Eduardo L. A. Macchione, Fabian Vargas, Marcilei Aparecida Guazzelli da Silveira:
Ionizing radiation effects on a COTS low-cost RISC microcontroller. LATS 2017: 1-4 - [c77]Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra:
Analysis of single-event upsets in a Microsemi ProAsic3E FPGA. LATS 2017: 1-4 - [c76]Felipe G. A. e Silva, Otávio A. de Lima, Walter da C. Freitas, Fabian Vargas, Jarbas Silveira, César A. M. Marcon:
An efficient, low-cost ECC approach for critical-application memories. SBCCI 2017: 198-203 - 2016
- [j24]Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros:
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. 32(3): 273-289 (2016) - [j23]Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas:
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. J. Electron. Test. 32(3): 315-328 (2016) - [j22]Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas:
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectron. Reliab. 67: 150-158 (2016) - [c75]Adelcio Biazi, César A. M. Marcon, Fauzi de M. Shubeita, Leticia B. Poehls, Thais Webber, Fabian Vargas:
A dynamic TDMA-based sleep scheduling to minimize WSN energy consumption. ICNSC 2016: 1-6 - [c74]Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar:
Gate-level modelling of NBTI-induced delays under process variations. LATS 2016: 75-80 - [c73]M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls:
Analyzing NBTI impact on SRAMs with resistive-open defects. LATS 2016: 87-92 - [c72]G. Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas:
Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects. VLSID 2016: 487-492 - [c71]Odilson T. Valle, Gerson F. Budke, Carlos Montez, Alex R. Pinto, Fernando Hernandez, Francisco Vasques, Fabian Vargas, Edmundo Gatti:
Experimental assessment of using network coding and cooperative diversity techniques in IEEE 802.15.4 wireless sensor networks. WFCS 2016: 1-4 - 2015
- [j21]Raphael Segabinazzi Ferreira, Fabian Vargas:
ShadowStack: A new approach for secure program execution. Microelectron. Reliab. 55(9-10): 2077-2081 (2015) - [c70]Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls:
SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic. DDECS 2015: 223-228 - [c69]Christofer de Oliveira, Leticia Bolzani Poehls, Fabian Vargas:
On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment. EMC Compo 2015: 61-66 - [c68]Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas:
NBTI-aware design of integrated circuits: a hardware-based approach. LATS 2015: 1-6 - [c67]N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls:
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. LATS 2015: 1-6 - [c66]Felipe Lavratti, Letícia Maria Bolzani Poehls, Fabian Vargas, Andrea Calimera, Enrico Macii:
Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs. VLSID 2015: 405-410 - [c65]Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Víctor H. Champac:
An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging. VTS 2015: 1-6 - 2014
- [j20]Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas, Rubem Dutra Ribeiro Fagundes:
An On-Chip Sensor to Monitor NBTI Effects in SRAMs. J. Electron. Test. 30(2): 159-169 (2014) - [j19]Pablo Briff, Ariel Lutenberg, Leonardo Rey Vega, Fabian Vargas, Mohammad N. Patwary:
A Primer on Energy-Efficient Synchronization of WSN Nodes over Correlated Rayleigh Fading Channels. IEEE Wirel. Commun. Lett. 3(1): 38-41 (2014) - [c64]Pablo Briff, Ariel Lutenberg, Leonardo Rey Vega, Fabian Vargas, Mohammad N. Patwary:
A novel control strategy for fail-safe cyclic data exchange in wireless sensor networks. LATW 2014: 1-5 - [c63]Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti:
Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW 2014: 1-6 - 2013
- [c62]Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls:
Identifying NBTI-Critical Paths in Nanoscale Logic. DSD 2013: 136-141 - [c61]C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer:
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI. EMC Compo 2013: 89-94 - [c60]Carlos Leong, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas:
Aging monitoring with local sensors in FPGA-based designs. FPL 2013: 1-4 - [c59]W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian:
Integrating embedded test infrastructure in SRAM cores to detect aging. IOLTS 2013: 25-30 - [c58]Felipe Lavratti, Letícia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas, Enrico Macii:
Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs. LATW 2013: 1-6 - 2012
- [j18]Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits. J. Electron. Test. 28(4): 421-434 (2012) - [j17]Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, N. Marroni, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas:
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. J. Electron. Test. 28(6): 777-789 (2012) - [j16]Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez:
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation. J. Electron. Test. 28(6): 803-816 (2012) - [c57]Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas:
On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. DDECS 2012: 354-359 - [c56]Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas:
Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM. LATW 2012: 1-6 - 2011
- [j15]Judit Freijedo, María Dolores Valdés, Lucía Costas, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Lower VDD Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing. J. Low Power Electron. 7(2): 185-198 (2011) - [j14]Víctor H. Champac, Fernanda Gusmão de Lima Kastensmidt, Letícia Maria Veiras Bolzani Poehls, Fabian Vargas, Yervant Zorian:
12th "IEEE Latin-American Test Workshop" Porto de Galinhas, Brazil, 27-30 March 2011. J. Low Power Electron. 7(4): 529-530 (2011) - [j13]Costas Argyrides, Raul Chipana, Fabian Vargas, Dhiraj K. Pradhan:
Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction. IEEE Trans. Reliab. 60(3): 528-537 (2011) - [c55]Dhiego Silva, Kleber Stangherlin, Letícia Maria Veiras Bolzani, Fabian Vargas:
A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded Systems. ETS 2011: 209 - [c54]Vasco Bexiga, Carlos Leong, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas:
Performance Failure Prediction Using Built-In Delay Sensors in FPGAs. FPL 2011: 301-304 - [c53]Dhiego Silva, Letícia Maria Veiras Bolzani, Fabian Vargas:
An intellectual property core to detect task schedulling-related faults in RTOS-based embedded systems. IOLTS 2011: 19-24 - [c52]Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Sebastián E. García, Edmundo Gatti, Fernando Hernandez, Ney Laert Vilar Calazans:
Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity. LATW 2011: 1-6 - [c51]Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Modeling the effect of process variations on the timing response of nanometer digital circuits. LATW 2011: 1-5 - [c50]Felipe Lavratti, Andrea Calimera, Letícia Maria Veiras Bolzani, Fabian Vargas, Enrico Macii:
A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale SRAMs. LATW 2011: 1-6 - [c49]Carlos Ivan Castro Marquez, Marius Strum, Wang Jiang Chau, Fabian Vargas:
Formally verifying an RTOS scheduling monitor IP core in embedded systems. LATW 2011: 1-6 - [c48]Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas:
Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study. LATW 2011: 1-6 - [c47]María Dolores Valdés, Judit Freijedo, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects. LATW 2011: 1-7 - 2010
- [j12]Judit Freijedo, Lucía Costas, Jorge Semião, Juan J. Rodríguez-Andina, María José Moure, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance. J. Low Power Electron. 6(2): 339-349 (2010) - [c46]Felipe Lavratti, Alex R. Pinto, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Barros Montez, Fernando Hernandez, Edmundo Gatti, C. Silva:
Evaluating a Transmission Power Self-Optimization Technique for WSN in EMI Environments. DSD 2010: 509-515 - [c45]Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira:
Investigating the Use of BICS to detect resistive-open defects in SRAMs. IOLTS 2010: 200-201 - [c44]Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas:
BICS-based March test for resistive-open defect detection in SRAMs. LATW 2010: 1-6 - [c43]Felipe Lavratti, Alex R. Pinto, Dárcio Prestes, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Montez:
Towards a transmission power self-optimization in reliable Wireless Sensor Networks. LATW 2010: 1-3
2000 – 2009
- 2009
- [c42]Jimmy Tarrillo, Letícia Maria Veiras Bolzani Poehls, Fabian Vargas:
A Hardware-Scheduler for Fault Detection in RTOS-Based Embedded Systems. DSD 2009: 341-347 - [c41]Fabian Vargas, Claudia A. Rocha, Bernardo Pianta, Marta Portela-García, Celia López-Ongil, Mario García-Valderas, Luis Entrena:
Briefing power/reliability optimization in embedded software design. IOLTS 2009: 185-186 - [c40]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. IOLTS 2009: 223-228 - [c39]Jorge Semião, Judit Freijedo, Marlon Moraes, M. Mallmann, Carlos Lemos Antunes, Juliano Benfica, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Juan J. Rodríguez-Andina, João Paulo Teixeira, Daniel Lupi, Edmundo Gatti, Luis Garcia, Fernando Hernandez:
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment. LATW 2009: 1-6 - 2008
- [j11]Jorge Semião, Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Leonardo Bisch Piccoli, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira:
Signal Integrity Enhancement in Digital Circuits. IEEE Des. Test Comput. 25(5): 452-461 (2008) - [j10]Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems. J. Low Power Electron. 4(3): 385-391 (2008) - [j9]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Time Management for Low-Power Design of Digital Systems. J. Low Power Electron. 4(3): 410-419 (2008) - [c38]Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37 - [c37]Costas Argyrides, Fabian Vargas, Marlon Moraes, Dhiraj K. Pradhan:
Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. IOLTS 2008: 155-160 - [c36]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. IOLTS 2008: 227-232 - 2007
- [c35]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300 - [c34]Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira:
Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311 - [c33]Fabian Vargas, Leonardo Piccoli, Juliano Benfica, Antonio A. de Alecrim Jr., Marlon Moraes:
Time-Sensitive Control-Flow Checking for Multitask Operating System-Based SoCs. IOLTS 2007: 93-100 - [c32]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172 - [c31]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212 - 2006
- [j8]Fabian Vargas:
2006 Latin American Test Workshop. IEEE Des. Test Comput. 23(3): 185 (2006) - [j7]Fabian Vargas:
Design and test on chip for EMC. IEEE Des. Test Comput. 23(6): 502-503 (2006) - [j6]Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante:
A New Hybrid Fault Detection Technique for Systems-on-a-Chip. IEEE Trans. Computers 55(2): 185-198 (2006) - [c30]Fabian Vargas, Leonardo Picolli, Antonio A. de Alecrim Jr., Marlon Moraes, Marcio Gama:
Summarizing a time-sensitive control-flow checking monitoring for multitask systems-on-chip. FPT 2006: 249-252 - [c29]Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira:
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262 - [c28]Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault Detection in Digital Systems. LATW 2006: 103-107 - [c27]Fabian Vargas, Juliano Benfica, Augusto Farina, Eduardo Bezerra, Edmundo Gatti, Luis Garcia, Daniel Lupi, Fernando Hernandez:
Observing SRAM-based FPGA Robustness in EMI-exposed Environments. LATW 2006: 201-206 - 2005
- [j5]D. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira:
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electron. Test. 21(4): 349-363 (2005) - [c26]Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante:
On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. DSN 2005: 50-58 - [c25]Fabian Vargas, D. L. Cavalcante, Edmundo Gatti, Dárcio Prestes, Daniel Lupi:
On the Proposition of an EMI-Based Fault Injection Approach. IOLTS 2005: 207-208 - [c24]Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS 2005: 281-286 - 2004
- [j4]Fabian Vargas, Víctor H. Champac:
Guest Editorial. J. Electron. Test. 20(4): 331-332 (2004) - [j3]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr., Diogo B. Brum, Eduardo Luis Rhod:
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems. J. Electron. Test. 20(4): 397-411 (2004) - [c23]Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS 2004: 5-10 - [c22]Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante:
Hybrid Soft Error Detection by Means of Infrastructure IP Cores. IOLTS 2004: 79-88 - 2003
- [j2]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. J. Electron. Test. 19(1): 61-72 (2003) - [c21]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr., Diogo B. Brum:
Briefing a New Approach to Improve the EMI Immunity of DSP Systems. Asian Test Symposium 2003: 468-473 - [c20]Fabian Vargas, Diogo B. Brum, Dárcio Prestes, Letícia Maria Veiras Bolzani, Eduardo Luis Rhod, Matteo Sonza Reorda:
Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy? IOLTS 2003: 163 - 2002
- [c19]Fabian Vargas, Djones Lettnin, Diogo B. Brum, Dárcio Prestes:
A New Learning Approach to Design Fault Tolerant ANNs: Finally a Zero HW-SW Overhead. Asian Test Symposium 2002: 218-223 - [c18]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
Experimental Results of a Recovery Block Scheme to Handle Noise in Speech Recognition Systems. Asian Test Symposium 2002: 224-229 - [c17]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
A New On-Line Robust Approach to Design Noise Immune Speech Recognition Systems. IOLTW 2002: 187 - [c16]Fabian Vargas, Rubem D. R. Fagundes, Daniel Barros Jr.:
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. LATW 2002: 4-10 - [c15]Fabian Vargas, Maria Cristina Felippetto de Castro, Marcello Macarthy, Djones Lettnin:
Electrocardiogram Pattern Recognition by Means of MLP Network and PCA: A Case Study on Equal Amount of Input Signal Types. SBRN 2002: 200-205 - 2001
- [j1]Eduardo Augusto Bezerra, Fabian Vargas, Michael Paul Gough:
Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques: A Case Study. J. Electron. Test. 17(2): 163-174 (2001) - [c14]Fabian Luis Vargas, Rubem Dutra Ribeiro Fagundes, D. Barros Júnior:
A FPGA-based Viterbi algorithm implementation for speech recognition systems. ICASSP 2001: 1217-1220 - [c13]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
A New Approach to Design Reliable Real-Time Speech Recognition Systems. IOLTW 2001: 187-191 - [c12]Fabian Vargas, Alexandre M. Amory:
Circuit Modeling and Fault Injection Approach to Predict SEU Rate and MTTF in Complex Circuits. LATW 2001: 6-12 - [c11]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
Orienting Redundancy and HW/SW Codesign Techniques Towards Speech Recognition Systems. LATW 2001: 226-233 - [c10]Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
Summarizing a New Approach to Design Speech Recognition Systems: A Reliable Noise-Immune HW-SW Version. SBCCI 2001: 109-114 - 2000
- [c9]Fabian Vargas, Alexandre M. Amory:
Transient-fault tolerant VHDL descriptions: a case-study for area overhead analysis. Asian Test Symposium 2000: 417-422 - [c8]Fabian Vargas, Alexandre M. Amory, Raoul Velazco:
Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL. IOLTW 2000: 67-72 - [c7]Fabian Vargas, Alexandre M. Amory, Raoul Velazco:
Fault-Tolerance in VHDL Description: Transient-Fault Injection & Early Reliability Estimation. LATW 2000: 29-35 - [c6]Eduardo Bezerra, Fabian Vargas, Michael Paul Gough:
Merging BIST and Configurable Computing Technology to Improve Availability in Space Applications. LATW 2000: 146-151 - [c5]Fabian Vargas, Alexandre M. Amory:
Recent Improvements on the Specification of Transient-Fault Tolerant VHDL Descriptions: A Case-Study for Area Overhead Analysis. SBCCI 2000: 249-254
1990 – 1999
- 1998
- [c4]Fabian Vargas, Eduardo A. Bezerra, L. Wulff, Daniel Barros Jr.:
Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems. Asian Test Symposium 1998: 52-57 - [c3]Fabian Vargas, Eduardo Bezerra, A. Terroso, Daniel Barros Jr.:
Reliability Verification of Fault-Tolerant Systems Design based on Mutation Analysis. SBCCI 1998: 55-59 - 1995
- [c2]Fabian Vargas, Michael Nicolaidis, Yervant Zorian:
An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. ITC 1995: 345-354 - 1993
- [c1]Fabian Luis Vargas, Michael Nicolaidis, B. Hamdi:
Quiescent current estimation based on quality requirements. VTS 1993: 33-39
Coauthor Index
Letícia Maria Veiras Bolzani
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Letícia Maria Bolzani Pöhls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Letícia Maria Bolzani Pöhls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
Thiago Copetti
aka: Thiago Santos Copetti
aka: Thiago Santos Copetti
Rubem D. R. Fagundes
aka: Rubem Dutra Ribeiro Fagundes
aka: Rubem Dutra Ribeiro Fagundes
G. Cardoso Medeiros
aka: Guilherme Cardoso Medeiros
aka: Guilherme Cardoso Medeiros
Marcelino B. Santos
aka: Marcelino Bicho Dos Santos
aka: Marcelino Bicho Dos Santos
Isabel C. Teixeira
aka: Isabel Maria Cacho Teixeira
aka: Isabel Maria Cacho Teixeira
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