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ORCIDBongkoo Kang
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2010 – 2019
- 2018
[j28]Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang:
Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress. Microelectron. Reliab. 88-90: 186-190 (2018)- [j27]Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang:
Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability. Microelectron. Reliab. 88-90: 191-195 (2018) - [j26]Sang-Won Lee
, Kyung-Min Lee, Yoon-Geol Choi, Bongkoo Kang:
Modularized Design of Active Charge Equalizer for Li-Ion Battery Pack. IEEE Trans. Ind. Electron. 65(11): 8697-8706 (2018) - 2017
- [j25]Giyoun Roh, Hyeokjin Kim, Cheolgyu Kim, Dongwoo Kim, Bongkoo Kang:
Fast and accurate method of lifetime estimation for HfSiON/SiO2 dielectric n-MOSFETs under positive bias temperature instability. Microelectron. Reliab. 72: 98-102 (2017) - [j24]Kyung-Min Lee, Sang-Won Lee, Yoon-Geol Choi, Bongkoo Kang:
Active Balancing of Li-Ion Battery Cells Using Transformer as Energy Carrier. IEEE Trans. Ind. Electron. 64(2): 1251-1257 (2017) - 2016
- [j23]Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang:
Degradation of pMOSFETs due to hot electron induced punchthrough. Microelectron. Reliab. 59: 13-17 (2016) - [j22]Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang:
Channel width dependence of AC stress on bulk nMOSFETs. Microelectron. Reliab. 64: 194-198 (2016) - 2015
- [j21]Kyung Min Lee, Yoochae Chung, Chang-Hyeon Sung, Bongkoo Kang:
Active Cell Balancing of Li-Ion Batteries Using LC Series Resonant Circuit. IEEE Trans. Ind. Electron. 62(9): 5491-5501 (2015) - 2014
- [j20]Yoochae Chung, Chang-Hyeon Sung, Jin-Ho Kim, Seung-Min Chae, Myung-Je Jeon, Bongkoo Kang:
Power-efficient drive circuit for plasma display panel. Displays 35(2): 66-73 (2014) - [j19]Cheolgyu Kim, Hyeokjin Kim, Bongkoo Kang:
Voltage dependent degradation of HfSiON/SiO2 nMOSFETs under positive bias temperature instability. Microelectron. Reliab. 54(11): 2383-2387 (2014) - 2013
- [j18]Seonhaeng Lee, Cheolgyu Kim, Hyeokjin Kim, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang:
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs. Microelectron. Reliab. 53(9-11): 1351-1354 (2013) - [c1]Chang-Hyeon Sung, Kyung-Min Lee, Bongkoo Kang:
Voltage equalizer for li-ion battery string using LC series resonance. IECON 2013: 1404-1409 - 2012
- [j17]C. H. Sung, J. H. Kim, Yoochae Chung, Myung-Je Jeon, J. W. Seo, Y. K. Jung, Bong Koo Kang:
Biased scan of plasma display panel for data voltage reduction. Displays 33(1): 21-27 (2012) - [j16]Dongwoo Kim, Seonhaeng Lee, Cheolgyu Kim, Chiho Lee, Jeongsoo Park, Bongkoo Kang:
Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress. Microelectron. Reliab. 52(9-10): 1901-1904 (2012) - [j15]Seonhaeng Lee, Dongwoo Kim, Cheolgyu Kim, N.-H. Lee, Gang-Jun Kim, Chiho Lee, Jeongsoo Park, Bongkoo Kang:
Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs. Microelectron. Reliab. 52(9-10): 1905-1908 (2012) - [j14]Seonhaeng Lee, Dongwoo Kim, Cheolgyu Kim, Chiho Lee, Jeongsoo Park, Bongkoo Kang:
Channel width dependence of mechanical stress effects induced by shallow trench isolation on device performance of nanoscale nMOSFETs. Microelectron. Reliab. 52(9-10): 1949-1952 (2012) - [j13]Jae-Jung Yun, Hyung-Jin Choe, Young-Ho Hwang, Yong-Kyu Park, Bongkoo Kang:
Improvement of Power-Conversion Efficiency of a DC-DC Boost Converter Using a Passive Snubber Circuit. IEEE Trans. Ind. Electron. 59(4): 1808-1814 (2012) - 2011
- [j12]Jae Joong Yun, Min Sup Song, Young-Ho Hwang, Bongkoo Kang:
Method of controlling external electrode fluorescent lamps for local dimming of liquid crystal displays. Displays 32(3): 142-149 (2011) - 2010
- [j11]J. H. Kim, Myung-Je Jeon, G. H. Hur, K. S. Lee, J. S. Kim, Bong Koo Kang:
Bipolar drive waveform for long-gap high-Xe plasma display panels. Displays 31(2): 67-72 (2010) - [j10]Min Sup Song, Yong-Kyu Park, Jae Joong Yun, Young-Ho Hwang, Bongkoo Kang:
Distributed circuit model for cold cathode fluorescent lamps in back-light unit of liquid crystal display. Displays 31(2): 104-110 (2010)
2000 – 2009
- 2009
- [j9]G. H. Huh, S. C. Lee, Myung-Je Jeon, Jin-Ho Kim, Bongkoo Kang:
Floating single sustain drive method for AC plasma display panel. Displays 30(1): 32-38 (2009) - [j8]Myung-Je Jeon, M. S. Chung, S. C. Lee, K. S. Lee, J. S. Kim, Bongkoo Kang:
Influence of wall charge on image sticking phenomena in AC plasma display panels. Displays 30(1): 39-43 (2009) - 2008
- [j7]Myung-Je Jeon, J. W. Seo, S. Y. Soh, S. H. Kim, J. G. Han, Bongkoo Kang:
Influence of wall charge distribution on time lag of address discharge in AC plasma display panels. Displays 29(3): 195-201 (2008) - 2007
- [j6]M. S. Chung, Myung-Je Jeon, S. C. Lee, Bong Koo Kang, H. J. Kim, S. S. Yang, J. S. Kim, Y. J. Ahn:
Effect of single crystalline MgO powder treatment of phosphor surface on discharge property of high-Xe AC plasma display panels. Displays 28(2): 68-73 (2007) - [j5]M. S. Chung, S. H. Kim, Myung-Je Jeon, Bong Koo Kang:
Improvement of picture quality of high Xe content plasma display panels based on facing discharge suppression. Displays 28(2): 74-80 (2007) - 2006
- [j4]S. Y. Soh, S. H. Kim, J. W. Seo, Y. K. Jung, Bongkoo Kang:
Cell parameter extraction method for AC plasma display panels. Displays 27(3): 97-107 (2006) - [j3]S. C. Lee, S. Y. Soh, J. W. Seo, Bongkoo Kang:
Versatile energy recovery circuit for driving AC plasma display panel with single sustain circuit board. Displays 27(4-5): 153-160 (2006) - 2005
- [j2]S. H. Kim, J. W. Seo, S. Y. Soh, Y. K. Jung, J. Y. Kim, Bongkoo Kang:
Drive waveform for high resolution and high Xe content AC plasma display panels. Displays 26(1): 45-53 (2005) - 2003
- [j1]Ki-Hyeon Park, Dong Eon Kim, Seong-Hoon Jeong, Bongkoo Kang:
Laminated magnetic flux sensor for thick-steel-plate control. IEEE Trans. Ind. Electron. 50(2): 379-384 (2003)
Coauthor Index
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