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ORCIDMohsen Raji
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2020 – today
- 2024
[i2]Mohammadamin Baghbanbashi, Mohsen Raji, Behnam Ghavami:
Quantizing YOLOv7: A Comprehensive Study. CoRR abs/2407.04943 (2024)- 2023
- [c13]Mohammadamin Baghbanbashi, Mohsen Raji, Behnam Ghavami:
Quantizing YOLOv7: A Comprehensive Study. CSICC 2023: 1-5 - 2022
- [j24]Mohsen Raji
, Mohaddaseh Nikseresht:
UMOTS: an uncertainty-aware multi-objective genetic algorithm-based static task scheduling for heterogeneous embedded systems. J. Supercomput. 78(1): 279-314 (2022) - [c12]Behnam Ghavami, Mahdi Sajedi, Mohsen Raji, Zhenman Fang, Lesley Shannon:
A Majority-based Approximate Adder for FPGAs. DSD 2022: 53-59 - 2021
- [j23]Mohsen Raji, Reza Mahmoudi, Behnam Ghavami, Saeed Keshavarzi:
Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment. IEEE Access 9: 114120-114134 (2021) - [j22]Mohaddaseh Nikseresht, Mohsen Raji:
MOGATS: a multi-objective genetic algorithm-based task scheduling for heterogeneous embedded systems. Int. J. Embed. Syst. 14(2): 171-184 (2021) - [j21]Arash Qodratnama, Farshad Khunjush, Mohsen Raji:
A methodology for the SPICE-Compatible modelling of metal-semiconductor-metal photodetectors for nanophotonic interconnects application. Microelectron. J. 115: 105170 (2021) - [j20]Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji:
A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability Optimization of Integrated Circuits. IEEE Trans. Emerg. Top. Comput. 9(2): 759-773 (2021) - [c11]Mohammad Zaree, Mohsen Raji:
FT-LFSR: A Fault Tolerant Architecture for Linear Feedback Shift Registers. CSICC 2021: 1-6 - [i1]Kiarash Saremi, Hossein Pedram, Behnam Ghavami, Mohsen Raji, Zhenman Fang, Lesley Shannon:
SeaPlace: Process Variation Aware Placement for Reliable Combinational Circuits against SETs and METs. CoRR abs/2112.04136 (2021) - 2020
- [j19]Hassun Vakilian Zand, Mohsen Raji, Hossein Pedram, Hossein Heidari SharifAbadi:
A genetic algorithm-based tasks scheduling in multicore processors considering energy consumption. Int. J. Embed. Syst. 13(3): 264-273 (2020) - [j18]Mohammad Eslami, Behnam Ghavami, Mohsen Raji, Ali Mahani:
A survey on fault injection methods of digital integrated circuits. Integr. 71: 154-163 (2020) - [j17]Mohammad Reza Rohanipoor, Behnam Ghavami, Mohsen Raji:
Improving Combinational Circuit Reliability Against Multiple Event Transients via a Partition and Restructuring Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(5): 1059-1072 (2020) - [j16]Atousa Jafari, Mohsen Raji, Behnam Ghavami:
Timing Reliability Improvement of Master-Slave Flip-Flops in the Presence of Aging Effects. IEEE Trans. Circuits Syst. 67-I(12): 4761-4773 (2020) - [c10]Seyed Milad Ebrahimipour, Behnam Ghavami, Hamid Mousavi, Mohsen Raji, Zhenman Fang, Lesley Shannon:
Aadam: A Fast, Accurate, and Versatile Aging-Aware Cell Library Delay Model using Feed-Forward Neural Network. ICCAD 2020: 31:1-31:9
2010 – 2019
- 2019
- [j15]Mohsen Raji, M. Amin Sabet, Behnam Ghavami:
Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme. IEEE Access 7: 66485-66495 (2019) - [j14]Behnam Ghavami, Mohsen Raji, Ramin Rasaizadi, Mashaallah Mashinchi:
Process variation-aware gate sizing with fuzzy geometric programming. Comput. Electr. Eng. 78: 259-270 (2019) - [j13]Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji:
Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits. IET Circuits Devices Syst. 13(7): 979-987 (2019) - 2018
- [j12]M. Amin Sabet, Behnam Ghavami, Mohsen Raji:
GPU-Accelerated Soft Error Rate Analysis of Large-Scale Integrated Circuits. IEEE Des. Test 35(6): 78-85 (2018) - [j11]Mohsen Raji, Behnam Ghavami:
Redressing fork constraints in nanoscale quasi-delay-insensitive asynchronous pipelines. J. Supercomput. 74(8): 3820-3840 (2018) - 2017
- [j10]Mohammad Reza Rohanipoor, Behnam Ghavami, Mohsen Raji:
Soft error tolerant design of combinational circuits based on a local logic substitution scheme. Microelectron. J. 67: 143-154 (2017) - [j9]M. Amin Sabet, Behnam Ghavami, Mohsen Raji:
A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing. IEEE Trans. Reliab. 66(1): 245-256 (2017) - [j8]Mohsen Raji, Behnam Ghavami:
Soft Error Rate Reduction of Combinational Circuits Using Gate Sizing in the Presence of Process Variations. IEEE Trans. Very Large Scale Integr. Syst. 25(1): 247-260 (2017) - 2016
- [j7]Mohsen Raji, Behnam Ghavami:
A Fast Statistical Soft Error Rate Estimation Method for Nano-scale Combinational Circuits. J. Electron. Test. 32(3): 291-305 (2016) - 2015
- [j6]Mohsen Raji, Hossein Pedram, Behnam Ghavami:
Soft error rate estimation of combinational circuits based on vulnerability analysis. IET Comput. Digit. Tech. 9(6): 311-320 (2015) - [j5]Mohsen Raji, Hossein Pedram, Behnam Ghavami:
A practical metric for soft error vulnerability analysis of combinational circuits. Microelectron. Reliab. 55(2): 448-460 (2015) - [c9]Mohsen Raji, Behnam Ghavami, Hossein Pedram:
Gate Resizing for Soft Error Rate Reduction in Nano-scale Digital Circuits Considering Process Variations. DSD 2015: 445-452 - 2014
- [c8]Mohsen Raji, Fereshte Saeedi, Behnam Ghavami, Hossein Pedram:
An Efficient Approach for Soft Error Rate Estimation of Combinational Circuits. DSD 2014: 567-574 - 2013
- [j4]Behnam Ghavami, Mohsen Raji, Hossein Pedram, Mehdi Baradaran Tahoori:
Design and Analysis of a Robust Carbon Nanotube-Based Asynchronous Primitive Circuit. ACM J. Emerg. Technol. Comput. Syst. 9(1): 4:1-4:27 (2013) - [j3]Behnam Ghavami, Mohsen Raji, Hossein Pedram, Massoud Pedram:
Statistical Functional Yield Estimation and Enhancement of CNFET-Based VLSI Circuits. IEEE Trans. Very Large Scale Integr. Syst. 21(5): 887-900 (2013) - 2011
- [j2]Mostafa Kishani, Hamid R. Zarandi, Hossein Pedram, Alireza Tajary, Mohsen Raji, Behnam Ghavami:
HVD: horizontal-vertical-diagonal error detecting and correcting code to protect against with soft errors. Des. Autom. Embed. Syst. 15(3-4): 289-310 (2011) - [c7]Behnam Ghavami, Mohsen Raji, Hossein Pedram, Omid Naghshineh Arjmand:
CNT-count Failure Characteristics of Carbon Nanotube FETs under Process Variations. DFT 2011: 86-92 - [c6]Behnam Ghavami, Mohsen Raji, Hossein Pedram:
Timing yield estimation of carbon nanotube-based digital circuits in the presence of nanotube density variation and metallic-nanotubes. ISQED 2011: 703-710 - [c5]Behnam Ghavami, Mohsen Raji, Hossein Pedram:
Metallic-CNT and Non-uniform CNTs Tolerant Design of CNFET-based Circuits Using Independent N2-Transistor Structures. ISVLSI 2011: 242-247 - 2010
- [j1]Mohsen Raji, Behnam Ghavami, Hossein Pedram, Hamid R. Zarandi:
Process variation-aware performance analysis of asynchronous circuits. Microelectron. J. 41(2-3): 99-108 (2010) - [c4]Behnam Ghavami, Alireza Tajary, Mohsen Raji, Hossein Pedram:
Defect and Variation Issues on Design Mapping of Reconfigurable Nanoscale Crossbars. ISVLSI 2010: 173-178 - [c3]Mohsen Raji, Alireza Tajary, Behnam Ghavami, Hossein Pedram, Hamid R. Zarandi:
Statistical Leakage Power Optimization of Asynchronous Circuits Considering Process Variations. PATMOS 2010: 126-136
2000 – 2009
- 2009
- [c2]Mohsen Raji, Behnam Ghavami, Hossein Pedram:
Statistical static performance analysis of asynchronous circuits considering process variation. ISQED 2009: 291-296 - [c1]Mohsen Raji, Behnam Ghavami, Hamid R. Zarandi, Hossein Pedram:
Process Variation Aware Performance Analysis of Asynchronous Circuits Considering Spatial Correlation. PATMOS 2009: 5-15
Coauthor Index
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last updated on 2024-08-13 20:43 CEST by the dblp team
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