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2020 – today
- 2024
[j5]Soham Roy
, Spencer K. Millican, Vishwani D. Agrawal:
A Survey and Recent Advances: Machine Intelligence in Electronic Testing. J. Electron. Test. 40(2): 139-158 (2024)- [c8]Soham Roy, Vishwani D. Agrawal:
An Amalgamated Testability Measure Derived from Machine Intelligence. VLSID 2024: 696-701 - 2023
- [i1]Soham Roy, Anubhab Baksi, Anupam Chattopadhyay:
Quantum Implementation of ASCON Linear Layer. IACR Cryptol. ePrint Arch. 2023: 617 (2023) - 2021
- [j4]Mrityunjoy Dey, Shoif Md Mia, Navonil Sarkar, Archan Bhattacharya, Soham Roy, Samir Malakar, Ram Sarkar:
A two-stage CNN-based hand-drawn electrical and electronic circuit component recognition system. Neural Comput. Appl. 33(20): 13367-13390 (2021) - [j3]Nachiketa Tarasia, Amulya Ratna Swain, Soham Roy, Udit Narayana Kar:
Improved Localized Sleep Scheduling Techniques to Prolong WSN Lifetime. Scalable Comput. Pract. Exp. 22(1): 81-92 (2021) - [c7]Rajdeep Chatterjee, Soham Roy, SK Hafizul Islam:
Trident U-Net: An Encoder Fusion for Improved Biomedical Image Segmentation. BIOMESIP 2021: 141-154 - [c6]Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
Unsupervised Learning in Test Generation for Digital Integrated Circuits. ETS 2021: 1-4 - [c5]Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator. VLSID 2021: 316-321 - [c4]Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. VTS 2021: 1-14 - 2020
- [j2]Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal:
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. J. Electron. Test. 36(1): 123-133 (2020) - [j1]Soham Roy, Archan Bhattacharya, Navonil Sarkar, Samir Malakar, Ram Sarkar:
Offline hand-drawn circuit component recognition using texture and shape-based features. Multim. Tools Appl. 79(41-42): 31353-31373 (2020) - [c3]Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
Machine Intelligence for Efficient Test Pattern Generation. ITC 2020: 1-5
2010 – 2019
- 2019
- [c2]Spencer K. Millican, Yang Sun, Soham Roy, Vishwani D. Agrawal:
Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training. ATS 2019: 13-18 - [c1]Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal:
Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. NATW 2019: 1-6
Coauthor Index
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