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ORCIDZhigang Ji
This is just a disambiguation page, and is not intended to be the bibliography of an actual person. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.
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Other persons with a similar name
- Zhigang Jia (aka: ZhiGang Jia, Zhi-Gang Jia)
- Zhigang Jiang
- Zhigang Jin
- Zhigang Jing
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2020 – today
- 2024
[j24]Pengpeng Ren, Yongkang Xue, Linglin Jing, Lining Zhang, Runsheng Wang, Zhigang Ji:
A strong physical unclonable function with machine learning immunity for Internet of Things application. Sci. China Inf. Sci. 67(1) (2024)- [j23]Ye Wei
, He Haitao, Kunhao Yuan, Gerald Schaefer, Zhigang Ji, Hui Fang:
A Memory-augmented Conditional Neural Process model for traffic prediction. Knowl. Based Syst. 304: 112578 (2024) - [j22]Jinfeng Ye, Pengpeng Ren, Yongkang Xue, Hui Fang, Zhigang Ji:
Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(6): 1862-1871 (2024) - [j21]Hai-Bao Chen, Xinjie Zhang, Wenjie Zhu, Jie Chen, Pengpeng Ren, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang:
DRGA-Based Second-Order Block Arnoldi Method for Model Order Reduction of MIMO RCS Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 71(5): 2410-2423 (2024) - [j20]Xiaolin Wang, Da Wang, Lei Guo, Pengpeng Ren, Zhigang Ji:
High-Throughput Addressable Test Structure Design for Nano-Scaled CMOS Device Characterization. IEEE Trans. Circuits Syst. II Express Briefs 71(9): 4041-4045 (2024) - [c38]Linglin Jing, Sheng Xu, Yifan Wang, Yuzhe Zhou, Tao Shen, Zhigang Ji, Hui Fang, Zhen Li, Siqi Sun:
CrossBind: Collaborative Cross-Modal Identification of Protein Nucleic-Acid-Binding Residues. AAAI 2024: 2661-2669 - [c37]Dinghao Chen, Wenjie Zhu, Xiaoman Yang, Pengpeng Ren, Zhigang Ji, Hai-Bao Chen:
Physics-Informed Learning for EPG-Based TDDB Assessment. ASPDAC 2024: 651-656 - [c36]Ye Wei, He Haitao, Gerald Schaefer, Zhigang Ji, Yifan Wang, Hui Fang:
Memory-facilitated Joint-space Shift Adaptation in Traffic Forecasting. IJCNN 2024: 1-8 - [c35]Shuying Wang, Yewei Zhang, Yunjoong Kim, Pengpeng Ren, Zhigang Ji:
A Thermal Profile Prediction Methodology for Nanosheet Circuits Featuring Cross-Layer Thermal Coupling Effect. IRPS 2024: 1-6 - [c34]Shiyu Xia, Longda Zhou, Kewei Wang, Xiaobin Fan, Yongkang Xue, Qi Shan, Hannian Wang, Pengpeng Ren, Zhigang Ji, Ru Huang:
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED. IRPS 2024: 1-7 - [c33]Yongkang Xue, Miaojia Yuan, Yu Li, Da Wang, Maokun Wu, Pengpeng Ren, Lining Zhang, Runsheng Wang, Zhigang Ji, Ru Huang:
Investigation of Positive Bias Temperature Instability in advanced FinFET nodes. IRPS 2024: 1-5 - [c32]Longda Zhou, Jie Li, Pengpeng Ren, Sheng Ye, Da Wang, Zheng Qiao, Zhigang Ji:
Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM. IRPS 2024: 1-6 - [c31]Da Wang, Yongkang Xue, Yong Liu, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang:
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification. IRPS 2024: 9 - [c30]Zixuan Sun, Yongkang Xue, Haoran Lu, Pengpeng Ren, Zirui Wang, Zhigang Ji, Runsheng Wang, Ru Huang:
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs. IRPS 2024: 72 - [c29]Yu Xiao, Chenyang Zhang, Da Wang, Yongkang Xue, Pengpeng Ren, Zhigang Ji:
A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation. IRPS 2024: 75 - [i2]Bin Lin, Tao Peng, Chen Zhang, Minmin Sun, Lanbo Li, Hanyu Zhao, Wencong Xiao, Qi Xu, Xiafei Qiu, Shen Li, Zhigang Ji, Yong Li, Wei Lin:
Infinite-LLM: Efficient LLM Service for Long Context with DistAttention and Distributed KVCache. CoRR abs/2401.02669 (2024) - 2023
- [j19]James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jianfu Zhang:
A Pragmatic Model to Predict Future Device Aging. IEEE Access 11: 127725-127736 (2023) - [j18]Xiang Liu, Pengpeng Ren, Hai-Bao Chen, Zhigang Ji, Junhua Liu, Runsheng Wang, Jianfu Zhang, Ru Huang:
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(4): 1346-1350 (2023) - [j17]Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen:
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(12): 4959-4972 (2023) - [j16]Xinfa Zhang, Zuodong Zhang, Yibo Lin, Zhigang Ji, Runsheng Wang, Ru Huang:
Efficient Aging-Aware Standard Cell Library Characterization Based on Sensitivity Analysis. IEEE Trans. Circuits Syst. II Express Briefs 70(2): 721-725 (2023) - [j15]Tianshu Hou, Peining Zhen, Zhigang Ji, Hai-Bao Chen:
A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis. ACM Trans. Design Autom. Electr. Syst. 28(4): 57:1-57:20 (2023) - [j14]Peining Zhen, Shuqi Wang, Suming Zhang, Xiaotao Yan, Wei Wang, Zhigang Ji, Hai-Bao Chen:
Towards Accurate Oriented Object Detection in Aerial Images with Adaptive Multi-level Feature Fusion. ACM Trans. Multim. Comput. Commun. Appl. 19(1): 6:1-6:22 (2023) - [c28]Kean Hong Tok, Jian Fu Zhang, James Brown, Zhigang Ji, Weidong Zhang:
Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps. ASICON 2023: 1-4 - [c27]Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang:
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. IRPS 2023: 1-6 - [c26]Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji:
Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM. IRPS 2023: 1-6 - [c25]Longda Zhou, Jie Li, Zheng Qiao, Pengpeng Ren, Zixuan Sun, Jianping Wang, Blacksmith Wu, Zhigang Ji, Runsheng Wang, Kanyu Cao, Ru Huang:
Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation. IRPS 2023: 1-10 - [c24]Kaicheng Yang, Yuhan Wu, Ruijie Miao, Tong Yang, Zirui Liu, Zicang Xu, Rui Qiu, Yikai Zhao, Hanglong Lv, Zhigang Ji, Gaogang Xie:
ChameleMon: Shifting Measurement Attention as Network State Changes. SIGCOMM 2023: 881-903 - [c23]Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang:
Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. VLSI Technology and Circuits 2023: 1-2 - [i1]Kaicheng Yang, Yuhan Wu, Ruijie Miao, Tong Yang, Zirui Liu, Zicang Xu, Rui Qiu, Yikai Zhao, Hanglong Lv, Zhigang Ji, Gaogang Xie:
ChameleMon: Shifting Measurement Attention as Network State Changes. CoRR abs/2301.00615 (2023) - 2022
- [j13]Xuepeng Zhan, Jiezhi Chen, Zhigang Ji:
Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors. Sci. China Inf. Sci. 65(8): 1-2 (2022) - [j12]Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen:
A Space-Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(12): 5501-5514 (2022) - [c22]Linglin Jing, Yifan Wang, Tailin Chen, Shirin Dora, Zhigang Ji, Hui Fang:
Towards a more efficient few-shot learning-based human gesture recognition via dynamic vision sensors. BMVC 2022: 938 - [c21]Pengpeng Ren, Xinfa Zhang, Junhua Liu, Runsheng Wang, Zhigang Ji, Ru Huang:
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications. IRPS 2022: 3 - [c20]Yong Liu, Pengpeng Ren, Da Wang, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang:
New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology. IRPS 2022: 6 - [c19]Da Wang, Yong Liu, Pengpeng Ren, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang:
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies. IRPS 2022: 7 - 2021
- [j11]Mehzabeen Mehedi, Kean Hong Tok, Zengliang Ye, Jianfu Zhang, Zhigang Ji, Weidong Zhang, John S. Marsland:
On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude. IEEE Access 9: 43551-43561 (2021) - [j10]Chunyang Liu, Pengpeng Ren, Bo Zhou, Jianfu Zhang, Hui Fang, Zhigang Ji:
Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing. IEEE Access 9: 168648-168655 (2021) - [j9]Peining Zhen, Hai-Bao Chen, Yuan Cheng, Zhigang Ji, Bin Liu, Hao Yu:
Fast Video Facial Expression Recognition by a Deeply Tensor-Compressed LSTM Neural Network for Mobile Devices. ACM Trans. Internet Things 2(4): 23:1-23:26 (2021) - [c18]Mehzabeen Mehedi, Kean Hong Tok, Jian Fu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland:
An integrated method for extracting the statistical distribution of RTN time constants. ASICON 2021: 1-4 - [c17]Zhigang Ji, Jianfu Zhang:
Understanding Generated RTN as an Entropy Source for True Random Number Generators. ICICDT 2021: 1-4 - [c16]Hao Chang, Longda Zhou, Hong Yang, Zhigang Ji, Qianqian Liu, Eddy Simoen, Huaxiang Yin, Wenwu Wang:
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. IRPS 2021: 1-5 - [c15]Longda Zhou, Zhaohao Zhang, Hong Yang, Zhigang Ji, Qianqian Liu, Qingzhu Zhang, Eddy Simoen, Huaxiang Yin, Jun Luo, Anyan Du, Chao Zhao, Wenwu Wang:
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. IRPS 2021: 1-7 - 2020
- [j8]Xuepeng Zhan, Yifang Xi, Qianwen Wang, Weiqiang Zhang, Zhigang Ji, Jiezhi Chen:
Dual-Point Technique for Multi-Trap RTN Signal Extraction. IEEE Access 8: 88141-88146 (2020) - [j7]Mehzabeen Mehedi, Kean Hong Tok, Jianfu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland:
An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants. IEEE Access 8: 182273-182282 (2020) - [j6]Koh Song Sang, Bo Zhou, Hui Fang, Po Yang, Zaili Yang, Qiang Yang, Lin Guan, Zhigang Ji:
Real-time deep reinforcement learning based vehicle navigation. Appl. Soft Comput. 96: 106694 (2020) - [c14]Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang:
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS 2020: 1-5 - [c13]Linglin Jing, Rui Gao, Zhigang Ji, Runsheng Wang:
"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs. IRPS 2020: 1-8 - [c12]Longda Zhou, Qingzhu Zhang, Hong Yang, Zhigang Ji, Zhaohao Zhang, Renren Xu, Huaxiang Yin, Wenwu Wang:
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. IRPS 2020: 1-6
2010 – 2019
- 2019
- [j5]Zhigang Ji, Haibao Chen, Xiuyan Li:
Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities. Sci. China Inf. Sci. 62(12): 226401 (2019) - [c11]Jianfu Zhang, Azrif Manut, Rui Gao, Mehzabeen Mehedi, Zhigang Ji, Weidong Zhang, John S. Marsland:
An assessment of RTN-induced threshold voltage jitter. ASICON 2019: 1-4 - [c10]Jian Fu Zhang, Zhigang Ji, Meng Duan, Wei Dong Zhang, Cezhou Zhao:
Voltage step stress: a technique for reducing test time of device ageing. ICICDT 2019: 1-4 - 2018
- [j4]Jianfu Zhang, Zhigang Ji, Wei Dong Zhang:
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction. Microelectron. Reliab. 80: 109-123 (2018) - 2017
- [c9]Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang:
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. ASICON 2017: 670-673 - [c8]Haoyu Song, Zhigang Ji, Yali Zhang, Yinben Xia:
3D Fabric: Differential Deceleration and Detour for Congestion Free Data Center Networks. SIGCOMM Posters and Demos 2017: 82-84 - 2015
- [j3]Longfei Dai, Wenguo Yang, Suixiang Gao, Yinben Xia, Mingming Zhu, Zhigang Ji:
Non-Real-Time Network Traffic in Software-Defined Networking: A Link Bandwidth Prediction-Based Algorithm. Comput. Inf. Sci. 8(1): 54-61 (2015) - [c7]Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang:
NBTI prediction and its induced time dependent variation. ASICON 2015: 1-4 - [c6]Zhigang Ji, Dimitri Linten, Roman Boschke, Geert Hellings, S. H. Chen, AliReza Alian, D. Zhou, Yves Mols, Tsvetan Ivanov, Jacopo Franco, Ben Kaczer, X. Zhang, R. Gao, Jianfu Zhang, Weidong Zhang, Nadine Collaert, Guido Groeseneken:
ESD characterization of planar InGaAs devices. IRPS 2015: 3 - 2014
- [j2]Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang, Weidong Zhang, Norhayati Soin, Ben Kaczer, Stefan De Gendt, Guido Groeseneken:
Energy distribution of positive charges in high-k dielectric. Microelectron. Reliab. 54(9-10): 2329-2333 (2014) - [c5]Longfei Dai, Wenguo Yang, Suixiang Gao, Yinben Xia, Mingming Zhu, Zhigang Ji:
EMD-Based Multi-Model Prediction for Network Traffic in Software-Defined Networks. MASS 2014: 539-544 - 2010
- [j1]Zhigang Ji:
The Research on Modeling Document Summarization for Audio-Based Knowledge Management. J. Softw. 5(11): 1208-1215 (2010)
2000 – 2009
- 2009
- [c4]Zhigang Ji:
Evaluation of Management Information System Based on Fuzzy AHP and Multiple Matter Elements. PACCS 2009: 657-660 - [c3]Zhigang Ji, Meiye Zhang, Zhenguo Zhang:
Evaluate the Selection of Logistics Centre Location Using SVM Based on Principal Component Analysis. PACCS 2009: 661-664 - [c2]Zhigang Ji, Niugai Fang, Haiyan Yang:
Research on Knowledge Management for Person in E-learning. SSME 2009: 460-463 - [c1]Zhigang Ji, Yajing Li:
The Application of RBF Neural Network on Construction Cost Forecasting. WKDD 2009: 32-35
Coauthor Index
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