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2020 – today
- 2024
[j7]Alecsandra Rusu
, Emilian David, Vasile Grosu, Marina Dana Topa, Andi Buzo, Bianca Carbunescu, Georg Pelz:
On Multivariate Electrical Performance Machine Learning Driven Pre-Silicon IC Adaptive Verification. IEEE Access 12: 136436-136450 (2024)- [c53]Seyedbehnam Beladi, Linus Maurer, Jonas Stricker, Georg Pelz:
A ML-Based Approach for Finding the Product Definition Space of Microelectronic Power Switches. DDECS 2024: 148-151 - [c52]Alecsandra Rusu, Emilian David, Marina Dana Topa, Vasile Grosu, Andi Buzo, Georg Pelz:
On Approaching Multivariate IC Pre-silicon Verification Using ML-based Adaptive Algorithms. IOLTS 2024: 1-3 - 2023
- [c51]Octavian Pascu, Catalin Visan, Georgian Nicolae, Mihai Boldeanu, Horia Cucu, Cristian Diaconu, Andi Buzo, Georg Pelz:
Efficient Multi-Objective Optimization for PVT Variation-Aware Circuit Sizing Using Surrogate Models and Smart Corner Sampling. ISLPED 2023: 1-6 - [c50]Cristian Manolache, Cristina Andronache, Alexandru Caranica, Horia Cucu, Andi Buzo, Cristian Diaconu, Georg Pelz:
Applying Multi-objective Acquisition Function Ensemble for a candidate proposal algorithm. SpeD 2023: 116-121 - [c49]Georgian Nicolae, Catalin Visan, Dan Curavale, Mihai Boldeanu, Horia Cucu, Andi Buzo, Georg Pelz:
A Study on Initial Population Sampling for Multi-Objective Optimization based on Differential Evolution and Bayesian Inference. SpeD 2023: 128-132 - [i2]Cristian Manolache, Cristina Andronache, Alexandru Caranica, Horia Cucu, Andi Buzo, Cristian Diaconu, Georg Pelz:
Adaptive Planning Search Algorithm for Analog Circuit Verification. CoRR abs/2306.13484 (2023) - 2022
- [j6]Catalin Visan, Octavian Pascu, Marius Stanescu, Elena-Diana Sandru, Cristian Diaconu, Andi Buzo, Georg Pelz, Horia Cucu:
Automated circuit sizing with multi-objective optimization based on differential evolution and Bayesian inference. Knowl. Based Syst. 258: 109987 (2022) - [j5]Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz:
Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations With Applications in Sensitivity Analysis and Yield Prediction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(1): 129-142 (2022) - [c48]Thomas Nirmaier, Manuel Harrant, Marc Huppmann, Wendy You, Georg Pelz:
Virtual Prototyping: Closing the digital gap between product requirements and post-Si verification. ITC 2022: 559-562 - [c47]Cristian Manolache, Alexandru Caranica, Marius Stanescu, Horia Cucu, Andi Buzo, Cristian Diaconu, Georg Pelz:
Advanced Operating Conditions Search applied in Analog Circuit Verification. SMACD 2022: 1-4 - [c46]Georgian Nicolae, Andi Buzo, Horia Cucu, Corneliu Burileanu, Georg Pelz:
Manufacturing Variation Estimation of On Resistance in Power Semiconductors. SMACD 2022: 1-4 - [i1]Catalin Visan, Octavian Pascu, Marius Stanescu, Elena-Diana Sandru, Cristian Diaconu, Andi Buzo, Georg Pelz, Horia Cucu:
Automated Circuit Sizing with Multi-objective Optimization based on Differential Evolution and Bayesian Inference. CoRR abs/2206.02391 (2022) - 2021
- [c45]Gazmend Alia, Andi Buzo, Hannes Maier-Flaig, Klaus-Willi Pieper, Linus Maurer, Georg Pelz:
Machine learning-based acceleration of Genetic Algorithms for Parameter Extraction of highly dimensional MOSFET Compact Models. ICECS 2021: 1-4 - [c44]Marc Huppmann, Manuel Harrant, Thomas Nirmaier, Andi Buzo, Linus Maurer, Georg Pelz:
Human- and Machine-Readable Requirements Formulation for Lab Verification Automation. ICECS 2021: 1-4 - [c43]Catalin Visan, Octavian Pascu, Marius Stanescu, Horia Cucu, Cristian Diaconu, Andi Buzo, Georg Pelz:
Versatility and Population Diversity of Evolutionary Algorithms in Automated Circuit Sizing Applications. SpeD 2021: 68-73 - 2020
- [c42]Ingrid Kovacs, Marina Dana Topa, Monica Ene, Andi Buzo, Georg Pelz:
A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits. DCIS 2020: 1-5 - [c41]Vasilica-Daniela Andries, Liviu Goras, Emilian David, Andi Buzo, Georg Pelz:
On the Pole-Placement Technique for the Design of a DC-DC Buck Converter Discrete PID Control. DDECS 2020: 1-4 - [c40]Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz:
A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification. ETS 2020: 1-2 - [c39]Elena-Diana Sandru, Emilian David, Georg Pelz:
Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to Process Variations. ICECS 2020: 1-2
2010 – 2019
- 2019
- [c38]Elena-Diana Sandru, Emilian David, Georg Pelz:
Pre-Silicon Yield Estimation using Machine Learning Regression. ICECS 2019: 103-104 - [c37]Elena-Diana Sandru, Corneliu Burileanu, Emilian David, Andi Buzo, Georg Pelz:
Modeling the Dependencies between Circuit and Technology Parameters for Sensitivity Analysis using Machine Learning Techniques. SMACD 2019: 237-240 - 2018
- [c36]Jonas Stricker, Benno Koeppl, Andi Buzo, Jérôme Kirscher, Linus Maurer, Georg Pelz:
Efficient Simulative Pass/Fail Characterization Applied to Automotive Power Steering. AI4I 2018: 69-72 - [c35]Ciprian V. Pop, Andi Buzo, Georg Pelz, Horia Cucu, Corneliu Burileanu:
Methodology for determining the influencing factors of lifetime variation for power devices. ETS 2018: 1-2 - [c34]Jonas Stricker, Clemens Kain, Jérôme Kirscher, Andi Buzo, Linus Maurer, Georg Pelz:
Semiconductor Component Fault Assessment and Probability Impact Estimation on Application Level. NORCAS 2018: 1-4 - [c33]Christine Forster, Jérôme Kirscher, Linus Maurer, Georg Pelz:
Metamodel-Based Performance Evaluation for an Electromechanical Automotive System. SMACD 2018: 1-9 - 2017
- [c32]Ingrid Kovacs, Marina Dana Topa, Andi Buzo, Georg Pelz:
Integrated circuits' characterization for non-normal data in semiconductor quality analysis. ETS 2017: 1-2 - [c31]Ciprian V. Pop, Corneliu Burileanu, Andi Buzo, Georg Pelz:
Application-aware lifetime estimation of power devices. ETS 2017: 1-2 - [c30]Ingrid Kovacs, Marina Dana Topa, Andi Buzo, Georg Pelz:
An accurate yield estimation approach for multivariate non-normal data in semiconductor quality analysis. SMACD 2017: 1-4 - 2016
- [c29]Christine Forster, Stefan Buschhorn, Monica Rafaila, Linus Maurer, Georg Pelz:
Cascading metamodels from different sources for performance analysis of a power module. FDL 2016: 1-8 - [c28]Alexandra Iosub, Jérôme Kirscher, Monica Rafaila, Andi Buzo, Georg Pelz, Liviu Goras:
Simulation-based approach to application fitness for an E-Bike. SAS 2016: 1-6 - [c27]Alexandra Iosub, Jérôme Kirscher, Andi Buzo, Georg Pelz, Liviu Goras:
On the influence of angle sensor nonidealities on the torque ripple in PMSM systems - An analytical approach. SMACD 2016: 1-4 - [c26]Özlem Karaca, Jérôme Kirscher, Arnaud Laroche, Andreas Tributsch, Linus Maurer, Georg Pelz:
Fault grouping for fault injection based simulation of AMS circuits in the context of functional safety. SMACD 2016: 1-4 - [c25]Sebastian Simon, Ozlem Karaca, Jérôme Kirscher, Alexander W. Rath, Georg Pelz, Linus Maurer:
Safety-oriented mixed-signal verification of automotive power devices in a UVM environment. SMACD 2016: 1-4 - [c24]Ingrid Kovacs, Alexandra Iosub, Marina Dana Topa, Andi Buzo, Georg Pelz:
A novel entropy-based sensitivity analysis approach for complex systems. SSCI 2016: 1-6 - 2015
- [c23]Markus Dobler, Manuel Harrant, Monica Rafaila, Georg Pelz, Wolfgang Rosenstiel, Martin Bogdan:
Bordersearch: an adaptive identification of failure regions. DATE 2015: 1036-1041 - 2014
- [c22]Manuel Harrant, Thomas Nirmaier, Jérôme Kirscher, Christoph Grimm, Georg Pelz:
Emulation-based robustness assessment for automotive smart-power ICs. DATE 2014: 1-6 - [c21]Thomas Nirmaier, Andreas Burger, Manuel Harrant, Alexander Viehl, Oliver Bringmann, Wolfgang Rosenstiel, Georg Pelz:
Mission profile aware robustness assessment of automotive power devices. DATE 2014: 1-6 - [c20]Özlem Karaca, Jérôme Kirscher, Linus Maurer, Georg Pelz:
Towards simulation based evaluation of safety goal violations in automotive systems. FDL 2014: 1-8 - [c19]Liana Musat, Markus Hubl, Andi Buzo, Georg Pelz, Susanne Kandl, Peter P. Puschner:
Semi-formal representation of requirements for automotive solutions using sysML. FDL 2014: 1-8 - [c18]Anamaria Oros, Marina Dana Topa, Roxana Daniela Amariutei, Andi Buzo, Monica Rafaila, Georg Pelz:
Robust response design for heterogeneous systems based on metamodels. ICECS 2014: 602-605 - 2013
- [c17]Markus Dobler, Wolfgang Rosenstiel, Martin Bogdan, Monica Rafaila, Dirk Hammerschmidt, Georg Pelz:
Rapid Design Space Exploration of a State-of-the-art PSI 5 Controller. MBMV 2013: 3-12 - 2012
- [c16]Thomas Nirmaier, Volker Meyer zu Bexten, Markus Tristl, Manuel Harrant, Matthias Kunze, Monica Rafaila, Julia Lau, Georg Pelz:
Measuring and improving the robustness of automotive smart power microelectronics. DATE 2012: 872-873 - [c15]Manuel Harrant, Thomas Nirmaier, Georg Pelz, Fabrizio Dona, Christoph Grimm:
Configurable load emulation using FPGA and power amplifiers for automotive power ICs. FDL 2012: 84-89 - [c14]Manuel Harrant, Thomas Nirmaier, Christoph Grimm, Georg Pelz:
Configurable Load Emulation Using FPGA and Power Amplifiers for Automotive Power ICs. FDL (Selected Papers) 2012: 109-126 - 2010
- [j4]Monica Rafaila, Christoph Grimm, Christian Decker, Georg Pelz:
Sequential design of experiments for effective model-based validation of electronic control units. Elektrotech. Informationstechnik 127(6): 164-170 (2010) - [c13]Monica Rafaila, Christian Decker, Christoph Grimm, Georg Pelz:
Simulation-based sensitivity and worst-case analyses of automotive electronics. DDECS 2010: 309-312 - [c12]Monica Rafaila, Jérôme Kirscher, Christian Decker, Georg Pelz, Christoph Grimm:
Design of Experiments for Reliable Operation of Electronics in Automotive Applications. FDL 2010: 222-227 - [c11]Georg Pelz, Monica Rafaila:
From Requirements to Comprehensive Verification of Smart Power ICs. MBMV 2010: 41-45
2000 – 2009
- 2009
- [c10]Thang Nguyen, Martin Duregger, Georg Pelz:
Full system verification of CAN network at high speed transmission rate using VHDL-AMS. BMAS 2009: 84-89 - [c9]Monica Rafaila, Christoph Decker, Georg Pelz, Christian Grimm:
Design of experiments for effective pre-silicon verification of automotive electronics. FDL 2009: 1-6 - [c8]Monica Rafaila, Christian Decker, Christoph Grimm, Karsten Einwich, Thomas Markwirth, Georg Pelz:
New Methods for System-level Verification using SystemC-AMS Extensions: Application to an Automotive ECU. MBMV 2009: 217-226 - 2008
- [c7]Jérôme Kirscher, Michael Lenz, Dieter Metzner, Georg Pelz:
Verification of an Automotive Headlight Leveling Circuit and Application Using Smart Component Property Extraction. BMAS 2008: 1-6 - [c6]Thang Nguyen, Joachim Haase, Georg Pelz:
Sensitivity analysis of passive CAN bus components to investigate signal integrity of CAN network physical layer. BMAS 2008: 55-60 - 2004
- [c5]Georg Pelz:
Entwurfs-Methodik für Automobil-Elektronik. MBMV 2004: 53-53 - 2001
- [c4]Georg Pelz:
Designing Circuits for Disk Drives. ICCD 2001: 256-261 - 2000
- [c3]Lars M. Voßkämper, Rainer Schmid, Georg Pelz:
Combining Models of Physical Effects for Describing Complex Electromechanical Devices. BMAS 2000: 42-45
1990 – 1999
- 1999
- [j3]Georg Pelz, André Lüdecke, Michael Leineweber, Günter Zimmer:
Schaltungssimulation mit FE-Modellen für mikroelektromechanische Systeme. Informationstechnik Tech. Inform. 41(4): 33-38 (1999) - 1996
- [c2]Georg Pelz, Jürgen Bielefeld, Günther Hess, Günter Zimmer:
Hardware/software-cosimulation for mechatronic system design. EURO-DAC 1996: 246-251 - 1994
- [j2]Georg Pelz, Uli Roettcher:
Pattern matching and refinement hybrid approach to circuit comparison. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(2): 264-276 (1994) - 1991
- [j1]Georg Pelz, Volker Meyer zu Bexten:
Efficient fracturing of all angle shaped VLSI mask pattern data. Integr. 10(2): 143-154 (1991) - [c1]Georg Pelz, Uli Roettcher:
Circuit Comparison by Hierarchical Pattern Matching. ICCAD 1991: 290-293
Coauthor Index
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last updated on 2024-10-23 21:24 CEST by the dblp team
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