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Markus Turtinen
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2010 – 2019
- 2019
- [j4]Jan Kamenický, Filip Sroubek, Barbara Zitová, Jari Hannuksela, Markus Turtinen:
Image Restoration in Portable Devices: Algorithms and Optimization. J. Signal Process. Syst. 91(1): 9-20 (2019) - 2015
- [c7]Jari Hannuksela, Matti Niskanen, Markus Turtinen:
Performance evaluation of image noise reduction computing on a mobile platform. SAMOS 2015: 332-337 - 2010
- [c6]Sébastien Marcel, Chris McCool, Pavel Matejka, Timo Ahonen, Jan Cernocký, Shayok Chakraborty, Vineeth Nallure Balasubramanian, Sethuraman Panchanathan, Chi-Ho Chan, Josef Kittler, Norman Poh, Benoit G. B. Fauve, Ondrej Glembek, Oldrich Plchot, Zdenek Jancik, Anthony Larcher, Christophe Lévy, Driss Matrouf, Jean-François Bonastre, Ping-Han Lee, Jui-Yu Hung, Si-Wei Wu, Yi-Ping Hung, Lukás Machlica, John S. D. Mason, Sandra Mau, Conrad Sanderson, David Monzo, Antonio Albiol, Hieu V. Nguyen, Li Bai, Yan Wang, Matti Niskanen, Markus Turtinen, Juan Arturo Nolazco-Flores, L. Paola García-Perera, Roberto Aceves-Lopez, Mauricio Villegas, Roberto Paredes:
On the Results of the First Mobile Biometry (MOBIO) Face and Speaker Verification Evaluation. ICPR Contests 2010: 210-225
2000 – 2009
- 2008
- [c5]Jari Hannuksela, Pekka Sangi, Markus Turtinen, Janne Heikkilä:
Face Tracking for Spatially Aware Mobile User Interfaces. ICISP 2008: 405-412 - 2007
- [b1]Markus Turtinen:
Learning and recognizing texture characteristics using local binary patterns. University of Oulu, Finland, 2007 - 2006
- [j3]Markus Turtinen, Matti Pietikäinen, Olli Silvén:
Visual Characterization of Paper Using Isomap and Local Binary Patterns. IEICE Trans. Inf. Syst. 89-D(7): 2076-2083 (2006) - [c4]Markus Turtinen, Matti Pietikäinen:
Contextual Analysis of Textured Scene Images. BMVC 2006: 849-858 - 2005
- [c3]Markus Turtinen, Matti Pietikäinen, Olli Silvén:
Visual Characterization of Paper Using Isomap and Local Binary Patterns. MVA 2005: 210-213 - 2004
- [j2]Matti Pietikäinen, Tomi Nurmela, Topi Mäenpää, Markus Turtinen:
View-based recognition of real-world textures. Pattern Recognit. 37(2): 313-323 (2004) - 2003
- [j1]Topi Mäenpää, Markus Turtinen, Matti Pietikäinen:
Real-time surface inspection by texture. Real Time Imaging 9(5): 289-296 (2003) - [c2]Matti Pietikäinen, Tomi Nurmela, Topi Mäenpää, Markus Turtinen:
View-based recognition of 3D-textured surfaces. ICIAP 2003: 530-535 - [c1]Markus Turtinen, Topi Mäenpää, Matti Pietikäinen:
Texture Classification by Combining Local Binary Pattern Features and a Self-Organizing Map. SCIA 2003: 1162-1169
Coauthor Index
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