Nearfield Instruments

Yesterday we had the pleasure of welcoming Constantijn Van Oranje-Nassau of Techleap to Nearfield Instruments . A great opportunity to dive deep into the challenges of advanced semiconductor device manufacturing and the unique metrology and inspection solutions Nearfield Instruments delivers to tackle those. A great discussion about the challenges deep tech scale-ups face and the exciting opportunities that lie ahead. Looking forward to continued collaboration and innovation! #DeepTech #Innovation #ScaleUp #TechLeap #semiconductor #metrology #inspection

Advances in chiplet era will affect both front-end and back-end processes, providing systems with increased precision and efficiency. Understanding what’s driving the yield and seeking correlation is a pressing need of semiconductor fabs. Innovation in metrology and inspection, with angstrom resolution, and at the same time high throughput is key to understand the yield and maintaining it. QUADRA with its high resolution and direct measurement capability, equipped with Lightning mode to minimize the gap with throughput of optical techniques, will solve a crucial part of metrology demands in chiplet era. Nearfield Instruments

Welcome on board Jeroen Verbiest! Jeroen Verbiest has been appointed as new Vice President of Sales, effective as per 1 August 2024. Prior to joining Nearfield Instruments , Jeroen has been with ASML since 2010, where he held several positions. His most recent role was Senior Vice President of Sales in Portland, USA. In this position, he demonstrated exceptional leadership and strategic vision, significantly contributing to the company’s growth. “Nearfield Instruments developed exciting Metrology and Inspection equipment that the semiconductor industry dearly needs as it moves to future nodes. I’m excited to join Nearfield at this crucial stage in its growth path to becoming a leader in the industry” Hamed Sadeghian (CEO): ‘With Jeroen’s leadership style and extensive experience, we are confident that our Sales team will reach new heights and achieve our strategic objectives.’

Nearfield Instruments Secures Purchase Order for its QUADRA Metrology System from Leading Semiconductor Manufacturing Fab in Asia Find out more on this exciting news: https://lnkd.in/gM-iDZxw

Nearfield Instruments Secures Purchase Order for its QUADRA Metrology System from Leading Semiconductor Manufacturing Fab in Asia Find out more on this exciting news: https://lnkd.in/gM-iDZxw

Nearfield Instruments has successfully closed a €135 million Series-C funding round. The funding round is lead by two new major investors, Walden Catalyst Ventures and Temasek, with M&G Investments acting as a co-investor. The success of this round is further underscored by the participation of existing investors Innovation Industries, Invest-NL, and ING. We are pleased to be supported by this new group of investors and are grateful for the continued support of our existing investors. Read more in our press releases: English: https://lnkd.in/eBYD4Htn Dutch: https://lnkd.in/eEtPPUg7

Nearfield Instruments awarded highly competed EIC ACCELERATOR funding. - 969 proposals - 68 companies - €411 million budget - 17 countries represented - 1 Nearfield! Proud to be among the winners, further accelerating our growth to serve our semiconductor manufacturing customers with our innovative metrology & inspection solutions!

We're thrilled to introduce Lightning Mode™ for our QUADRA® in-line #semiconductor metrology system! This groundbreaking feature boosts image acquisition speed by over 160 times of current state-of-the-art, establishing a new industry benchmark. With its #angstrom precision, non-destructive nature, and exceptional throughput, QUADRA is pivotal in accelerating yield optimization in #memory, #HBM and #logic processes. It also addresses the growing demands in #AI chip systems and hybrid bonding applications. (https://lnkd.in/eh-8a-GQ)

Today at Semicon West, Nearfield Instruments launched Lightning Mode™, a new feature for QUADRA®, the semiconductor industry’s highest-throughput, in-line atomic force microscopy (AFM) metrology system for advanced semiconductor devices. QUADRA, combined with the new Lightning Mode, boosts productivity with a more than 160-fold increase in image acquisition speed when benchmarked against existing state-of-the-art automated AFM systems. Read all about here: https://lnkd.in/eU4EmrQz

A great overview article in Het Financieele Dagblad today about the exciting, fast-growing journey of Nearfield Instruments , with all its challenges and opportunities. We keep pushing to serve our customers making the manufacturing processes leaner and the fabs greener! Read the Het Financieele Dagblad article here: https://lnkd.in/eFzQDuKR #semiconductor #equipment #metrology #inspection #solutions #makingfabsgreener