Alex Garcia’s Post

Join Thermo Fisher Scientific's next #semiconductor webinar on March 26 (Americas) / March 27 (Asia Pacific) to see how the Thermo Scientific Metrios 6 (S)TEM can help overcome challenges associated with measuring the critical dimension and compositional distribution of beam-sensitive DRAM capacitor structures. Learn about: - Interfacial diffusion and distribution of high-k material within DRAM capacitors during STEM-EDS data collection - The effect of the electron beam and its impact on #metrology characterization - Strategies to optimize EDS data collection with minimal beam damage, high-throughput, and reproducible metrology

Join Thermo Fisher Scientific's next #semiconductor webinar on March 26 (Americas) / March 27 (Asia Pacific) to see how the Thermo Scientific Metrios 6 (S)TEM can help overcome challenges associated with measuring the critical dimension and compositional distribution of beam-sensitive DRAM capacitor structures. Learn about: - Interfacial diffusion and distribution of high-k material within DRAM capacitors during STEM-EDS data collection - The effect of the electron beam and its impact on #metrology characterization - Strategies to optimize EDS data collection with minimal beam damage, high-throughput, and reproducible metrology

Join Thermo Fisher Scientific's next #semiconductor webinar on March 26 (Americas) / March 27 (Asia Pacific) to see how the Thermo Scientific Metrios 6 (S)TEM can help overcome challenges associated with measuring the critical dimension and compositional distribution of beam-sensitive DRAM capacitor structures. Learn about: - Interfacial diffusion and distribution of high-k material within DRAM capacitors during STEM-EDS data collection - The effect of the electron beam and its impact on #metrology characterization - Strategies to optimize EDS data collection with minimal beam damage, high-throughput, and reproducible metrology

In this study, see how Thermo Fisher Scientific's #ElectronMicroscopy solutions were used to successfully test a 'minimal resin embedding' method for tackling two challenges related to serial block face scanning electron microscopy: charging and finding the ROI. #VolumeEM

Application of digital image correlation for <em>in-situ</em> deformation studies using transmission electron microscopy https://lnkd.in/g273H8Fz

Transmission Electron Microscopy pinpoints how next-generation devices degrade https://lnkd.in/e3c3dmQ4 #microscopy #spintronicdevices #wileyanalyticalscience

🔬 Happy to share our article on #electrochemiluminescence microscopy! Enhancing Electrochemiluminescence Intensity Through Emission Layer Control #ZanutAlessandra #electrochemistry

SEM imaging and EDS elemental analysis: Even though scanning electron microscopy (SEM) has made tremendous advances, it can be considered by new users to be a complicated technique. Sample preparation, alignments, cost of ownership, and difficulties with analytical techniques prevent widespread adoption. We set out to resolve these challenges in order to make a truly accessible SEM without compromising on flexibility. Our goal was to make microscopy an easy and enjoyable experience in which you should not have to fight the microscope to obtain quality data. The result is the Thermo Scientific Axia ChemiSEM Scanning Electron Microscope, a system in which obtaining SEM-EDS data is no longer a chore. EDS is no longer just an afterthought—chemical data and imaging have now become one. For more details: https://lnkd.in/d-wUCJsm

We propose a refined theoretical framework for the scattering-type SNOM to accurately predict the optical signatures of core-shell nanoparticles and illuminate potential and perhaps unexpected excitation paths, in this Nano Letters article.

ChemiSEM Technology is now available on Apreo and Quattro FESEMs. Researchers can now benefit from seamless integration for accurate and rapid #ElementalAnalysis. Stay at the forefront of electron microscopy innovation and learn more about the advantages of ChemiSEM here. #ElectronMicroscopy #MaterialsScience