We have another wafer prober and are particularly looking forward to your wafer test requests, however challenging they may be
🌟 Exciting News! 🌟 We are thrilled to announce the addition of our new Accretech AP3000 Probe Station to our semiconductor wafer test services lineup! 🎉 This advanced prober, equipped with the ATT L300T-60-LN Low Noise Thermal Chuck, significantly enhances our testing capabilities. Here are some key features: 🔹 Wide Temperature Range: Supports a temperature range from -60°C to 200°C, allowing for comprehensive testing under various conditions. 🔹 Low Noise and Vibration: Ensures stable and precise measurements with minimal electrical noise and vibration, crucial for high-precision applications. 🔹 Tilt Compensation: Allows for better probe-to-pad alignment, improving accuracy and reliability in our testing processes. 🔹 High Precision and Stability: With a temperature resolution of 0.01°C and stability of ±0.1°C, our system guarantees consistent and accurate temperature control. With these cutting-edge features, we are set to deliver even more precise and reliable semiconductor wafer testing services, meeting the highest industry standards. So, we can perform even more wafer test and these system features are very beneficial for wafer scale image sensors, ultra-high-speed CIS, low noise detectors and sensors, stacked and high dynamic range imagers. Stay tuned for more updates as we continue to expand and enhance our testing capabilities. Thank you for your continued support! aSpect web: https://lnkd.in/ez_rWQUw aSpect @ LinkedIn: https://lnkd.in/epNEMEsh #OSAT #WaferTesting #EWS #aSpectTestService #siliconsaxony #flanderssemiconductors
