Cohu, Inc.’s Post

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Cohu, Inc. will be attending the Korean Test Conference (KTC) this year and James Ko will be presenting “Managing measurement path capacitance in DDIC Source Channel testing.” In this paper, JinSoo will discuss solutions on how to reduce the variation in capacitance of signal lines between channels on the load board. To learn more, visit: https://lnkd.in/dRKivBFk #semiconductors #semiconductorindustry #ATE #testing #DDIC  

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