Delong Instruments’ Post

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/90cOCz Watch the video on youtube: 🌐 https://okt.to/zW3Gph #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

Why Choose NovelBeam Microscope Objective Lens？ As the critical component of any microscopy imaging system, the objective lens plays a central role in determining the quality of images.   NovelBeam provides various objective lenses, which are widely used in life science, industrial inspection, laser processing, scientific research, education, etc.   Feature *Plan apo, plan fluorite and plan achromatic objective lenses are available *Suitable for brightfield or fluorescence microscopy *Infinitely corrected optical systems *Excellent price-to-performance ratio   #Optics #NovelBeam #NovelBeamOptics #LaserTechnology #laser #PrecisionOptics #laserwelding #lenseschallenge #diodelaer #ObjectiveLenses #Objectives

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/JwAY7P Watch the video on youtube: 🌐 https://okt.to/MCpGmu #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/jbW4Mw Watch the video on youtube: 🌐 https://okt.to/eliXLa #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/IV6u8s Watch the video on youtube: 🌐 https://okt.to/YSFODy #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

Discover the cutting-edge capabilities of the Leica Microsystems SP8 Laser Scanning Confocal Microscope, one of the advanced tools at the ASU Core Research Facilities Advanced Light Microscopy Core! 🔬 This high-resolution imaging system is ideal for studying live or fixed cells and tissues with exceptional clarity. Key features include its tunable white light laser, adjustable from 470-670nm, and adaptable filters that support up to five channels of simultaneous imaging or nearly infinite sequential scanning possibilities. Combined with Hybrid Photodetector Gallium Arsenide Phosphide (HyD GaAsP) detectors, the SP8 minimizes fluorescence bleed-through and phototoxicity, ensuring the highest quality results for your research. 🌈 Learn more about the Leica SP8 and how it can elevate your imaging capabilities: https://lnkd.in/g5w_qsPX Special thanks to Page Baluch of the Advanced Light Microscopy Core Facility for making this video possible! 🎥 #ASUCoreFacilities #ASUCores #ASUResearch #Microscopy #LaserScanningConfocal #Innovation #Research #LaserScanningConfocalMicroscope #Microscope ASU Knowledge Enterprise School of Life Sciences at Arizona State University

A classical way to image nanoscale structures in cells is with high-powered, expensive super-resolution microscopes. As an alternative, Massachusetts Institute of Technology researchers have developed a way to expand tissue before imaging it — a technique that allows them to achieve nanoscale resolution with a conventional light microscope: https://bit.ly/3YwyS0a

Push the boundaries of imaging with the MI-SIM super-resolution microscope. Equipped with 25 advanced imaging modes—including brightfield, fluorescence widefield, oblique widefield, TIRF widefield, 2D/3D SIM, and TIRF-SIM—it adapts seamlessly to diverse samples and experimental needs. From cell membranes to the intricate 3D structures of thick samples, MI-SIM offers unmatched imaging resolution and depth, overcoming traditional microscopy limitations. Watch the video to see MI-SIM in action for yourself 👇 📌 Sample: Microtubules in the shoot apical meristem of Arabidopsis thaliana Data source: Prof. Zhao’s Lab, Northwestern Polytechnical University #SuperResolution #Microscopy #LiveCellImaging #Imaging

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/qpF4fV Watch the video on youtube: 🌐 https://okt.to/frh0F1 #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/sN9kzp Watch the video on youtube: 🌐 https://okt.to/D6kwvf #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research