Jefferson Lab’s Post

LayTec's #TRIton for III-V Lab   We are very proud to announce that III-V Lab, a joint Lab between Nokia, Thales TRT and CEA Leti, has ordered two TRItons, our #endpoint #metrology product for plasma etch monitoring. This purchase order follows the recent successful collaboration between III-V Lab and LayTec on repeatable and reproducible plasma etch depth control during the manufacturing of InP lasers and detectors, as well as GaN transistors. The two TRIton units will be installed on an Oxford Instrument Plasma Technology and SENTECH etch chamber. "We have already tested the TRIton monitoring efficiency during plasma etching on our ICP tools. The multi-wavelength metrology allowed us to get accurate real-time positioning during the etching process, even in the thinnest layers of a few nanometers. With the high resolution camera, one can easily identify the etching test-pads. The 3 wavelengths FPO profiles can be simulated and prepared for accurate plasma etch end-pointing anywhere in the heterostructures", say Jean Decobert, epitaxy team leader at III-V Lab, and Delphine Néel, processing research engineer at the III-V Lab technology platform. TRIton is based on a combination of three wavelengths and offers unprecedented depth resolutions. Its performances enable extraction of key #thinfilm parameters such as refractive index and absorption coefficient with a high precision, as well as real time etch rate extraction and thin film interface location. The cooperation has involved a broad range of cross functional expertise and skillsets, offering a unique framework to tackle all together many #compound #semiconductor technological challenges. We are going to deploy additional TRIton systems on further etch chambers in the near future.   For more information, contact us at info@laytec.de.   #laytec #insitu #metrology #etching #etch #plasma #semiconductor #epitaxy #nynomicmember #nynomic #spectroscopy #photonics #lifesciences #cleantech #greentech

LiteScope AFM-in-SEM, technology, presents a diverse array of measurement modes to delve into various sample properties, including our CPEM (Correlative Probe & Electron Microscopy). 🔬 Thanks to its compact design and a state-of-the-art digital signal processing unit, the LiteScope AFM-in-SEM is not only powerful but also user-friendly, fitting directly into the SEM’s chamber. This integration facilitates a variety of applications from materials science to semiconductor research, enhancing your investigative potential without the need for extensive equipment changes. ✅ Explore diverse measurement modes including Mechanical, Electro-mechanical, Electrical, Magnetic, and Spectroscopy modes, each designed to deliver precise and actionable insights into your samples. ➡️ https://lnkd.in/dMNCZhtm #NenoVision #LiteScope #AFMinSEM #CorrelativeMicroscopy

High linearity electro-optic modulator and microwave photon application With the increasing requirements of communication systems, in order to further improve the transmission efficiency of signals, people will fuse photons and electrons to achieve complementary advantages, and microwave photonics will be born. The electro-optical modulator is needed for the conversion of electricity to light in microwave photonic systems, and this key step usually determines the performance of the whole system. Since the conversion of radio frequency signal to optical domain is an analog signal process, and ordinary electro-optical modulators have inherent nonlinearity, there is serious signal distortion in the conversion process. In order to achieve approximate linear modulation, the operating point of the modulator is usually fixed at the orthogonal bias point, but it still cannot meet the requirements of microwave photon link for the linearity of the modulator. Electro-optic modulators with high linearity are urgently needed. The high-speed refractive index modulation of silicon materials is usually achieved by the free carrier plasma dispersion (FCD) effect. Both the FCD effect and PN junction modulation are nonlinear, which makes the silicon modulator less linear than the lithium niobate modulator. Lithium niobate materials exhibit excellent electro-optical modulation properties due to their Pucker effect. At the same time, lithium niobate material has the advantages of large bandwidth, good modulation characteristics, low loss, easy integration and compatibility with semiconductor process, the use of thin film lithium niobate to make high-performance electro-optical modulator, compared with silicon almost no “short plate”, but also to achieve high linearity. Thin film lithium niobate (LNOI) electro-optic modulator on insulator has become a promising development direction. With the development of thin film lithium niobate material preparation technology and waveguide etching technology, the high conversion efficiency and higher integration of thin film lithium niobate electro-optic modulator has become the field of international academia and industry. #Optical #photonics #semiconductor #Optics #opticalcenter #SiliconPhotonics #photodetectors #optomechanics #laser Read more: https://lnkd.in/eEiNWZRC

Insights on laser beam profilers await

In today's AFM webinar, our guest speakers introduce Reverse Tip Sample Scanning Probe Microscopy (RTS SPM) which overcomes the single-tip barrier of traditional SPM approach. Secure your spot ➡️ https://lnkd.in/gzkr6YYS The standout feature of this RTS SPM arrangement is the ability to change tips seamlessly, greatly boosting data collection efficiency in application spaces requiring frequent tip replacements. During operations in RTS configuration, the cantilever-mounted sample scans one of thousands of tips present on the probe chip. When a tip wears out, the operator repositions the cantilever onto an adjacent fresh tip, which takes mere seconds. After a comprehensive introduction of the RTS SPM concept, our speakers will cover some related crucial aspects, including: • Nanofabrication of probe chips • Sample preparation • Measurements and applications Webinar Speakers 📣 Nemanja Peric, Ph.D., SPM Researcher, imec, Belgium 📣 Pieter Lagrain, Engineer, imec, Belgium 📣 Peter De Wolf, Ph.D., Snr Director Technology & App Development AFM, Bruker #AFM #materialscience #microscopy

Schlieren, Switzerland, March 11th, 2024. EXALOS, the world’s leading manufacturer of Superluminescent Light-Emitting Diodes (SLEDs), has expanded its product portfolio in the red wavelength range with new broadband SLEDs at 633 nm, 638 nm and 680 nm, in addition to its well-established SLEDs at 650 nm. The new 633nm SLEDs deliver a broad optical spectrum with a 3dB bandwidth of 5-7 nm and with a highly polarized free-space output power of 10-15 mW, making them ideal sources for various interferometry applications at the HeNe wavelength of 632.8 nm. These new SLEDs will be also available in 14pin BTF modules with single-mode (SM) or polarization-maintaining (PM) fibers. Due to advanced semiconductor processes developed over the past few years, EXALOS is now able to offer high-power 638nm SLEDs and LDs with a free-space output power of up to 50 mW. This new generation of high-power, single-mode red superluminescent and laser diodes will support various high-end applications, including display and AR/VR architectures. At the upper end of the red emission spectrum, EXALOS is now offering broadband SLEDs at 680 nm with a broad bandwidth of 10 nm, available as 14pin BTF modules with either SMF or PMF output. These devices offer excellent long-term stability and reliability, making them suitable for various industrial applications that require light sources for 24/7 operation over several years. Learn more: https://lnkd.in/gCSabQ4T #exalos #laser #photonics #sled #semiconductor #light #appliedphysics #research #artificialintelligence #sciencenews #rgb #technology

Can’t wait!! John is a true expert in this topic and always has such insightful information to share. This time, he’ll be diving deeper into tuning the embedded controls while performing PDH locking. Let me know if you have any questions in a DM!

#Article Integrated Polarization-Splitting Grating Coupler for Chip-Scale Atomic Magnetometer by Jinsheng Hu, et al. https://lnkd.in/emxsmbQZ   MDPI Beihang University #integratedphotonics #gratingcoupler #FDTD #chipscaleatomicmagnetometer #biomagneticimaging #openaccess #Abstract Atomic magnetometers (AMs) are widely acknowledged as one of the most sensitive kind of instruments for bio-magnetic field measurement. Recently, there has been growing interest in developing chip-scale AMs through nanophotonics and current CMOS-compatible nanofabrication technology, in pursuit of substantial reduction in volume and cost. In this study, an integrated polarization-splitting grating coupler is demonstrated to achieve both efficient coupling and polarization splitting at the D1 transition wavelength of rubidium (795 nm). With this device, linearly polarized probe light that experienced optical rotation due to magnetically induced circular birefringence (of alkali medium) can be coupled and split into individual output ports. This is especially advantageous for emerging chip-scale AMs in that differential detection of ultra-weak magnetic field can be achieved through compact planar optical components. In addition, the device is designed with silicon nitride material on silicon dioxide that is deposited on a silicon substrate, being compatible with the current CMOS nanofabrication industry. Our study paves the way for the development of on-chip AMs that are the foundation for future multi-channel high-spatial resolution bio-magnetic imaging instruments.

🔬 Unveiling the Hidden Nanoworld: High-Contrast X-ray Microscopy Reveals Copper Interconnects in Advanced Microchips Nanomaterials MDPI Breakthrough in semiconductor failure analysis! 🔍 Researchers have developed a powerful X-ray microscopy technique that provides unprecedented 5x contrast enhancement for imaging copper nanostructures in microelectronic devices. This innovative approach, using Ga-Kα radiation, allows for high-resolution visualization of sub-micron copper interconnects - the critical pathways that power our digital world. 💻 Physical failure analysis and reliability engineering in the semiconductor industry will greatly benefit from these high-contrast X-ray images. Watch the full video to learn more about this cutting-edge technology: https://lnkd.in/g7VEJtGb #XRayMicroscopy #Nanostructures #CopperInterconnects #SemiconductorFailureAnalysis #MaterialsScience

Microfabricated platforms to investigate cell mechanical properties https://lnkd.in/g-JUx7MU #BioMEMS #Single cell #Mechanical properties #Microdevices Mechanical stimulation has been imposed on living cells using several approaches. Most early investigations were conducted on groups of cells, utilizing techniques such as substrate deformation and flow-induced shear. To investigate the properties of cells individually, many conventional techniques were utilized, such as AFM, optical traps/optical tweezers, magnetic beads, and micropipette aspiration. In specific mechanical interrogations, micro-electro-mechanical systems (MEMS) have been designed to probe single cells in different interrogation modes. To exert loads on the cells, these devices often comprise piezo-electric driven actuators that attach directly to the cell or move a structure on which cells are attached. Uniaxial and biaxial pullers, micropillars, and cantilever beams are examples of MEMS devices. In this review, the methodologies to analyze single cell activity under external loads using microfabricated devices will be examined. We will focus on the mechanical interrogation in three different regimes: compression, traction, and tension, and discuss different microfabricated platforms designed for these purposes. #innovation #technology #researsh