Xenics’ Post

Optimizing Semiconductor Production with Infrared Inspection In the fast-paced world of semiconductor manufacturing, ensuring product yield and quality is paramount. Infrared inspection plays a vital role in achieving this goal, both at the wafer level and in packaged devices. See Through Silicon: Unveiling Defects with SWIR Cameras Short-wave infrared (SWIR) cameras use light with a longer wavelength than visible light, allowing them to see through silicon ingots. This enables inspectors to identify defects invisible to the naked eye, such as impurities, voids, and inclusions. Early detection of these imperfections helps to ensure higher quality wafers and reduce production costs. Beyond SWIR: Emission Microscopy for Comprehensive Analysis Emission microscopy, a technique used to detect photonic radiation emitted from defect sites. This method provides valuable insights into the nature of the defect, complementing the information obtained from SWIR imaging. Superior Inspection Solutions We offer a range of infrared inspection solutions to meet your specific needs, including the Manx SQ, Bobcat+, Lynx SQ, and Wildcat+ series. Contact us today to discuss how infrared inspection can optimize your semiconductor manufacturing process! https://bit.ly/459GkzY #Semiconductor #Infrared #Inspection #SWIR #Wildcat #Manx #Bobcat #Lynx #Xenics #Exosens

Optimizing Semiconductor Production with Infrared Inspection In the fast-paced world of semiconductor manufacturing, ensuring product yield and quality is paramount. Infrared inspection plays a vital role in achieving this goal, both at the wafer level and in packaged devices. See Through Silicon: Unveiling Defects with SWIR Cameras Short-wave infrared (SWIR) cameras use light with a longer wavelength than visible light, allowing them to see through silicon ingots. This enables inspectors to identify defects invisible to the naked eye, such as impurities, voids, and inclusions. Early detection of these imperfections helps to ensure higher quality wafers and reduce production costs. Beyond SWIR: Emission Microscopy for Comprehensive Analysis Emission microscopy, a technique used to detect photonic radiation emitted from defect sites. This method provides valuable insights into the nature of the defect, complementing the information obtained from SWIR imaging. Superior Inspection Solutions We offer a range of infrared inspection solutions to meet your specific needs, including the Manx SQ, Bobcat+, Lynx SQ, and Wildcat+ series. Contact us today to discuss how infrared inspection can optimize your semiconductor manufacturing process! https://bit.ly/459GkzY #Semiconductor #Infrared #Inspection #Silicon #Emission #Microscopy #Wildcat #Manx #Bobcat #Lynx #SWIR #Xenics #Exosens

Optimizing Semiconductor Production with Infrared Inspection In the fast-paced world of semiconductor manufacturing, ensuring product yield and quality is paramount. Infrared inspection plays a vital role in achieving this goal, both at the wafer level and in packaged devices. See Through Silicon: Unveiling Defects with SWIR Cameras Short-wave infrared (SWIR) cameras use light with a longer wavelength than visible light, allowing them to see through silicon ingots. This enables inspectors to identify defects invisible to the naked eye, such as impurities, voids, and inclusions. Early detection of these imperfections helps to ensure higher quality wafers and reduce production costs. Beyond SWIR: Emission Microscopy for Comprehensive Analysis Emission microscopy, a technique used to detect photonic radiation emitted from defect sites. This method provides valuable insights into the nature of the defect, complementing the information obtained from SWIR imaging. Superior Inspection Solutions We offer a range of infrared inspection solutions to meet your specific needs, including the Manx SQ, Bobcat+, Lynx SQ, and Wildcat+ series. Contact us today to discuss how infrared inspection can optimize your semiconductor manufacturing process! To know more: https://bit.ly/459GkzY #Semiconductor #Infrared #Inspection #Silicon #Emission #Microscopy #Wildcat #Manx #Bobcat #Lynx #SWIR #Xenics #Exosens

Optimizing Semiconductor Production with Infrared Inspection In the fast-paced world of semiconductor manufacturing, ensuring product yield and quality is paramount. Infrared inspection plays a vital role in achieving this goal, both at the wafer level and in packaged devices. See Through Silicon: Unveiling Defects with SWIR Cameras Short-wave infrared (SWIR) cameras use light with a longer wavelength than visible light, allowing them to see through silicon ingots. This enables inspectors to identify defects invisible to the naked eye, such as impurities, voids, and inclusions. Early detection of these imperfections helps to ensure higher quality wafers and reduce production costs. Beyond SWIR: Emission Microscopy for Comprehensive Analysis Emission microscopy, a technique used to detect photonic radiation emitted from defect sites. This method provides valuable insights into the nature of the defect, complementing the information obtained from SWIR imaging. Superior Inspection Solutions We offer a range of infrared inspection solutions to meet your specific needs, including the Manx SQ, Bobcat+, Lynx SQ, and Wildcat+ series. Contact us today to discuss how infrared inspection can optimize your semiconductor manufacturing process! To know more: https://bit.ly/459GkzY #Semiconductor #Infrared #Inspection #Silicon #Emission #Microscopy #Wildcat #Manx #Bobcat #Lynx #SWIR #Xenics #Exosens

Ensure Flawless Semiconductor Wafers with SWIR InGaAs Cameras Silicon (Si) is the foundation of many electronic components. However, impurities and defects in silicon bricks and ingots can cause problems further down the production line. See Through Silicon with Short-Wave Infrared Imaging SWIR InGaAs cameras use light with a longer wavelength than visible light. This allows them to see through silicon ingots, revealing defects that would be invisible to the naked eye. By catching these imperfections early, you can ensure higher quality wafers and reduce production costs. Products for Every Need We offer a variety of SWIR InGaAs cameras to meet your specific needs, including the Bobcat/Bobcat+, Wildcat+, Lynx, and Manx series. Let us help you achieve smoother wafer production and higher yields. https://bit.ly/459GkzY #SiliconIngotInspection #Semiconductor #Wafers #SWIR #Bobcat #Wildcat #Lynx #Manx #Xenics #Exosens

Ultra-Compact Laser Photoelectric Sensor (UF-BD/GT Series) 1.Enhanced interference resistance with proprietary chip technology 2.Cost-effective with high precision and quality

Advanced semiconductor metrology using picosecond laser ultrasonics Chromacity Ltd reports how its Chromacity 520 femtosecond laser system is being used for rapid, non-contact, non-destructive characterisation of semiconductor thin films. Picosecond laser ultrasonics, or picosecond ultrasonics, is a technique for studying materials using high frequency acoustic pulses generated and detected by ultrashort optical pulses typically <1 ps in duration. #SemiconductorMetrology #LaserUltrasonics #AdvancedTechnology #PicosecondLasers #NextGenMetrology Chromacity Ltd https://lnkd.in/evrXcwkr

It is becoming increasingly difficult to guarantee known good interposers, since the demands on these devices are growing. In this recent Semiconductor Engineering article, Bruker expert Soham Dey discusses how white-light interferometry can be a valuable #interposer screening tool. 💬 “… [T]he latest TSVs with a 2 µm opening and up to 40 µm are successfully measured in case of WLI. Depths for all TSVs included in the field of view are recorded within a single vertical scan, allowing high speed screening without the hurdle of modeling.” 📃 Read more of Dr. Dey’s comments in the full article: https://lnkd.in/g3uZsNzf #semiconductor #semiconductormanufacturing

Are you interested in delving deeper into defect inspection and metrology for #semiconductors? We have released four comprehensive #whitepapers and #casestudies addressing critical challenges in semiconductor manufacturing and highlighting the role of optical inspection. Gain valuable insights with Confovis! 🤓 👉You can download our resources here: https://bit.ly/426Wvwp #semiconductorindustry #semiconductormanufacturing

Telecentric lenses are essential in semiconductor inspection and metrology applications because they provide a consistent magnification across the entire field of view (FoV), eliminating perspective distortion. Key applications include: 🔍 Wafer Inspection – Ensures wafers are flawless and ready for the next stage of production. 🔍 Die Bonding Alignment – Delivers precise alignment to guarantee optimal bonding performance. 🔍 Solder Paste Inspection (SPI) – Identifies defects in paste application with exceptional accuracy. VS Technology manufactures a wide range of telecentric lenses designed to meet the demanding needs of the semiconductor and electronics industries. https://lnkd.in/eqW2bCtm #machinevision #visioninspection #visionsystem #lens #optics