ZEISS Microscopy

📣 We’re excited to announce our latest innovation in microscopy technology…introducing the new ZEISS Crossbeam 550 Samplefab FIB-SEM! Built for efficiency and throughput in the semiconductor lab, Crossbeam 550 Samplefab is optimized for fully-automated TEM sample preparation. Crossbeam 550 Samplefab promises an industry-leading automation yield of >90% for processing lamellae from bulk to TEM grid without operator intervention. Attending ISFTA 2024? Come see us at booth #601 to learn more about the new Crossbeam 550 Samplefab and other microscopy solutions from ZEISS for solving failure analysis challenges. In the meantime, check out the video below for a preview or click here to get more information https://lnkd.in/dYsC9Wk5

We are thrilled to announce that our company has been honored with the 2024 Microscopy Today Innovation Award for ZEISS Volutome! 🏆🎉 We are proud to provide the research community with an in-chamber ultramicrotome for serial block-face imaging with FE-SEMs, enabling 3D volumetric imaging of the ultrastructure of biological samples. With applications in neuroscience, cell biology, cancer research, and plant science, ZEISS Volutome represents a significant advancement in the field of microscopy, offering increased stability, sensitivity, and speed for unattended imaging. Thank you for your ongoing support and partnership in advancing scientific research and discovery! Learn more about ZEISS Volutome: https://lnkd.in/ewg-bGAa

Heading to ISFTA 2024 next week? So are we!🔬 🗓️ Date: October 28 – November 1, 2024 📍 Location: Hilton San Diego Bayfront, San Diego, Calif. In step with the theme at #ISTFA2024, our experts are giving paper presentations on AI-enabled methods including: - Using AI-based image segmentation for FIB-SEM tomography data - Correlative microscopic workflow powered by AI to accelerate failure analysis of next-gen semiconductor packages - Integrating an AI-powered multimodal microscopy workflow to identify laser-induced defects Join us for all six of our paper presentations. See the full schedule here: https://lnkd.in/dtSJdtgs We look forward to sharing our insights with you!

Are you attending the 50th annual ISTFA Conference? If so, join us for our four tutorial sessions at the conference! 🔬 📅 Date: October 28 – November 1, 2024 📍 Location: Hilton San Diego Bayfront, San Diego, Calif. Our team of experts will share methods for solving failure analysis challenges including AI-driven advancements in image processing, analysis and 3D modeling, defect localization, scanning electron microscopy, and 3D X-ray microscopy. View our full schedule of sessions here: https://lnkd.in/dkXj6Jhc We look forward to seeing you there!

Check out our latest article on advanced package failure analysis (FA) with artificial intelligence (AI)-powered 3D X-ray microscopy (XRM) in the September/October issue of Chip Scale Review Magazine. 3D X-ray microscopy features high-resolution, non-destructive imaging capabilities and an ability to clearly image different interconnects in complex multi-chip packages. And with ZEISS AI-powered XRM, there are no trade-offs that must be balanced between field-of-view and resolution. Read the article to learn how AI is being applied to the reconstruction step to enhance imaging quality and speed data acquisition by 4x: https://lnkd.in/gXFwXMJu

Meet ZEISS at ISTFA 2024 in San Diego (USA). With over 10 talks and panel discussions, ZEISS experts will present solutions in: - artificial intelligence-powered fault isolation - failure analysis - yield enhancement Stop by booth 601 to see a preview of our new FIB-SEM solutions. And sign up for an in-booth demo of our new VersaXRM 730 3D X-ray microscope. Take a look at our schedule: https://lnkd.in/eUQN66aV

👏 Thank you very much to Gabriel Krens and Institute of Science and Technology Austria for a great location and cooperation on the Tissue Clearing Workshop! Looking forward to further exciting Workshops on the latest Microscopy Technologies. 🔬

Excited for Lab Innovations 2024? Join us on October 30-31 at Stand E60! Connect with our partners, Appleton Woods Ltd, and explore how the ZEISS Digital Classroom and our complete range of solutions can elevate your research experience. 🔬 Discover the latest in microscopy, automation, and more. Don't miss out—come see what’s possible for your lab!

Happy World Sight Day! 👁️ Today, we celebrate the beauty and importance of sight, and acknowledge the challenges faced by those with visual impairments. At the Natural History Museum 🏛️, a team led by Dr. Alex Ball and PhD student Kate Burton has been working on revolutionizing the museum experience for the visually impaired. They used microscopy data to transform science into a tactile experience. 🔬 👐 3D-printed models of museum objects allow people to touch and explore microscopic details, such as butterfly wings and tiny fossils. We're proud to support their efforts to make science more accessible and engaging for all. Explore the full story: https://lnkd.in/eMsC84_C #WorldSightDay #Museum #3DModels #NHM

Dresden Semiconductor Applications Lab Grand Opening Check out our recent grand opening celebration of the ZEISS Microscopy Semiconductor Applications Lab in Dresden, Germany, part of the ZEISS Innovation Hub Dresden that opened last May. 📸 We’re thrilled to introduce this state-of-the-art facility to the #semiconductor industry. The lab is dedicated to addressing new physical analysis challenges and pushing the limits of nanoscale analysis with the ZEISS Crossbeam focused ion beam-scanning electron microscope (FIB-SEM) and is strategically located in the heart of semiconductor innovation within Europe, allowing for close collaboration with semiconductor industry customers and partners. Find more information here: https://lnkd.in/dZZectsR #ZEISS #Semiconductors #Microscopy #FailureAnalysis #Innovation