Bruker Nano Surfaces & Metrology

Building on 55 years of surface measurement innovation and technology leadership, Dektak Pro™ sets a new standard for stylus profilometer performance. The system uniquely delivers the highest quality data with unrivaled ease of use. ➡️ https://lnkd.in/gaMM2DbF 𝗧𝗵𝗶𝘀 𝟭𝟭𝘁𝗵-𝗴𝗲𝗻𝗲𝗿𝗮𝘁𝗶𝗼𝗻 𝗗𝗲𝗸𝘁𝗮𝗸® 𝘀𝘆𝘀𝘁𝗲𝗺 𝗰𝗼𝗺𝗯𝗶𝗻𝗲𝘀: • Unmatched accuracy and better than 4 A repeatability • Accelerated measurement and analysis speed • A suite of Bruker-exclusive versatility and ease-of-use features Only Dektak Pro provides the latest stylus profilometry advances and reliability needed to support your cutting-edge research and industrial applications well into the future. #Microelectronics #Biomaterials #thickfilms

🏎💨 𝗘𝘃𝗲𝗿 𝘄𝗼𝗻𝗱𝗲𝗿𝗲𝗱 𝘄𝗵𝘆 𝗙𝟭 𝘁𝗲𝗮𝗺𝘀 𝘀𝘄𝗶𝘁𝗰𝗵 𝘁𝗶𝗿𝗲𝘀 𝘀𝗼 𝗼𝗳𝘁𝗲𝗻? ⏱ It’s primarily because the surface condition of racing tires significantly impacts lap times. A tire that’s ~4 times as rough (average roughness, Sa) can decrease lap time by as much as 2-3 seconds on a 60 second lap. With each lap around the track, the tires change rapidly. ⚫ Smooth, new tires can mold to the track, gripping any imperfections in the surface. ⚫ On the other hand, the buildup of rubber debris (or existence of pits) on used tires will result in sub-optimal contact with the track, translating to slower times. Here we compare the surface height over an area for a new tire and a used tire. 🔬 Data collected with NPFLEX-1000, a Bruker 3D optical profiler that can easily accommodate large samples. 📝 Racing expertise and tire provided by Robert Wang; data collected by Nishant K. #automotive #F1 #formula1

𝗟𝗲𝗮𝗿𝗻 𝗵𝗼𝘄 𝗻𝗲𝘄 𝗳𝗲𝗲𝗱𝗯𝗮𝗰𝗸 𝗮𝗹𝗴𝗼𝗿𝗶𝘁𝗵𝗺𝘀 𝗮𝗻𝗱 𝗲𝗹𝗲𝘃𝗮𝘁𝗲𝗱-𝘁𝗲𝗺𝗽𝗲𝗿𝗮𝘁𝘂𝗿𝗲 𝗦𝗥𝗝𝗧𝘀 𝗶𝗺𝗽𝗿𝗼𝘃𝗲 𝗰𝗿𝗲𝗲𝗽 𝗹𝗶𝗳𝗲𝘁𝗶𝗺𝗲 𝗽𝗿𝗲𝗱𝗶𝗰𝘁𝗶𝗼𝗻𝘀. Register 👉 https://lnkd.in/gFD_u_bR Traditional creep testing is time- and resource-intensive. Nanoindentation creep testing is more efficient, but has historically been limited in its accuracy due to the influx of fresh material as the contact area grows during indentation. Recent developments have worked to combat this limitation. 𝗝𝗼𝗶𝗻 𝘂𝘀 𝗳𝗼𝗿 𝘁𝗵𝗶𝘀 𝘄𝗲𝗯𝗶𝗻𝗮𝗿 𝘁𝗼 𝘀𝗲𝗲: • How new displacement control feedback algorithms improve time-dependent measurements on the TI 990 TriboIndenter. • Recent work combining high-throughput, high-temperature indentation strain rate jump tests (SRJT) with only a few bulk dead-load creep tests to determine creep lifetime. • Experimental datasets from Grade 91, FeCrAl, and oxide dispersion strengthened (ODS) steels that have been engineered for service under extreme conditions. 𝗪𝗲𝗯𝗶𝗻𝗮𝗿 𝗦𝗽𝗲𝗮𝗸𝗲𝗿𝘀: 📣 Prof. Nathan Mara, University of Minnesota 📣 Douglas Stauffer, Ph.D., Bruker #materialsscience #nanoindentation #webinar

Bruker Spatial Biology is going to provide unmatched technology for #genomics, transcriptomics, and more. We can’t wait to see what novel insights researchers make with this addition! #SpatialBiology #Bruker #Innovation

𝗗𝗿𝗶𝘃𝗶𝗻𝗴 𝗦𝘁𝘆𝗹𝘂𝘀 𝗣𝗿𝗼𝗳𝗶𝗹𝗶𝗻𝗴 𝗜𝗻𝗻𝗼𝘃𝗮𝘁𝗶𝗼𝗻 𝟱𝟱+ 𝗬𝗲𝗮𝗿𝘀 𝗟𝗮𝘁𝗲𝗿 Bruker's new Dektak Pro ▶ https://lnkd.in/guwHF9Ci   Dektak Pro takes the next step forward in stylus profiling innovation, providing even more enhanced operability, reliability, and measurement accuracy to enhance and extend the qualities that make Dektak synonymous with stylus profiling.   🔼 Follow the link above to take a look at the brochure!   #Microelectronics #Biomaterials #thickfilms

𝗝𝗼𝗶𝗻 𝗼𝘂𝗿 𝗡𝗮𝗻𝗼𝗜𝗥 𝘁𝗲𝗮𝗺 𝗳𝗼𝗿 𝘁𝗵𝗶𝘀 𝗹𝗶𝘃𝗲 𝘄𝗲𝗯𝗶𝗻𝗮𝗿 𝘄𝗵𝗶𝗰𝗵 𝘄𝗶𝗹𝗹 𝗽𝗿𝗼𝘃𝗶𝗱𝗲 𝗮𝗻 𝗶𝗻𝘁𝗿𝗼𝗱𝘂𝗰𝘁𝗶𝗼𝗻 𝘁𝗼 𝗻𝗮𝗻𝗼𝘀𝗰𝗮𝗹𝗲 𝗶𝗻𝗳𝗿𝗮𝗿𝗲𝗱 #𝘀𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝘆 𝗮𝗻𝗱 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝘄𝗶𝘁𝗵 𝗽𝗵𝗼𝘁𝗼𝘁𝗵𝗲𝗿𝗺𝗮𝗹 𝗔𝗙𝗠-𝗜𝗥. Register today 👉 https://lnkd.in/gC-XWxeJ This novel technique has a lateral resolution 1000x better than traditional FTIR and <1 nm detection sensitivity with model-free interpretation. AFM-IR achieves this by using an AFM probe as the detector of photothermal expansion. This opens a variety of applications on both organic and inorganic materials where nanometer sensitivity and resolution are key. In this webinar we will: • Introduce the photothermal AFM-IR technique • Explore the surprisingly simple mechanism underlying the technique • Highlight a few of its many broad applications • Demonstrate photothermal AFM-IR using the Dimension IconIR system • Hold a Q&A session with the team Cassandra Phillips, Qichi Hu and Peter De Wolf #materialsscience #nanotechnology

A systematic study with TONS of data, all to answer: 𝗪𝗵𝗮𝘁 𝗶𝘀 𝘁𝗵𝗲 𝗲𝗳𝗳𝗲𝗰𝘁 𝗼𝗳 𝗿𝗲𝗹𝗮𝘁𝗶𝘃𝗲 𝗵𝘂𝗺𝗶𝗱𝗶𝘁𝘆 𝗶𝗻 𝗰𝗼𝗻𝗱𝘂𝗰𝘁𝗶𝘃𝗲 𝗔𝗙𝗠? A recent open-access article in Advanced Materials showcases the dedicated efforts of the authors to clarify the true effects of relative humidity (RH) on conductive AFM (CAFM or C-AFM). ⭐ The authors, Yue YUAN and Mario Lanza, used Bruker CONTV-PT value line Pt-coated AFM probes alongside RMN-25PT300B solid PT probes on a Dimension Icon AFM platform for this study. “They systematically characterize the effects of RH at 7 different values (from 4% to 54%) in over 17,000 locations on 10 different samples (insulators, semiconductors and metals) using 2 different probe types!... There are any number of useful experimental tips and tricks throughout the article, so I highly recommend a deeper dive at the link, especially if you are planning some CAFM measurement.” 📢 Snr Manager AFM Probes, Ian Armstrong in his #TipsTuesday post ❗Bonus❗ Dr. Lanza was a guest speaker at our webinar “AFM-Based Characterization of the Properties of 2D Materials and Heterostructures” back in February. He talked about the use of current limitation on the Dimension Icon and comparison of Pt-coated versus solid Pt tips, which are topics also included in this paper. 📰Read the full article: https://lnkd.in/ghWvVaxV 🎬Watch the webinar where Dr. Lanza is a speaker: https://lnkd.in/g3WSjdpG [Image reprinted from Y.Yuan and M.Lanza, Advanced Materials, (2024) DOI: 10.1002/adma.202405932, licensed under CC BY 4.0.]

📚 Get instant, all-in-one access to our most popular resources exploring the capabilities, advantages, and practical considerations for 3D surface measurement using white light interferometry (WLI)-based techniques. ➡️ https://lnkd.in/gq4ZW_XT This knowledge pack includes: 3️⃣ full-length application notes 2️⃣ full-length webinar recordings 1️⃣ real-time technical demo #automotive #aerospace #semiconductor

“Edge defects can be a major cause of wafer breakage in the fab, which disrupts the production line and can lead to very high cost.” 📣 Bruker’s John Wall (Compound Semi Business Product Manager), in the recent Semiconductor Engineering article entitled 𝘋𝘦𝘧𝘦𝘤𝘵 𝘊𝘩𝘢𝘭𝘭𝘦𝘯𝘨𝘦𝘴 𝘎𝘳𝘰𝘸 𝘈𝘵 𝘛𝘩𝘦 𝘞𝘢𝘧𝘦𝘳 𝘌𝘥𝘨𝘦. Defect management plays a critical role in the modern semiconductor manufacturing process. If wafers break due to undetected edge defects, it can result in the significant loss of product and time. Bruker’s solution types for defect management mentioned in the article are: · 𝗫-𝗿𝗮𝘆 𝗱𝗶𝗳𝗳𝗿𝗮𝗰𝘁𝗶𝗼𝗻 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 (𝗫𝗥𝗗𝗜) – a technique that is sensitive to strain fields caused by even the smallest distortions in the crystalline lattice, like epilayer dislocations in Si/SiGe superlattice structures · 𝗪𝗵𝗶𝘁𝗲-𝗹𝗶𝗴𝗵𝘁 𝗶𝗻𝘁𝗲𝗿𝗳𝗲𝗿𝗼𝗺𝗲𝘁𝗿𝘆 (𝗪𝗟𝗜) – an optical profiling method that has a wide field of view plus high enough lateral and vertical sensitivity to characterize features like wafer edge roll off. · 𝗔𝘁𝗼𝗺𝗶𝗰 𝗳𝗼𝗿𝗰𝗲 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗔𝗙𝗠) – a widely used topography and property metrology technique with a broad range of uses, including the evaluation of copper dishing during the CMP processes. 💬 Bruker experts who contributed to this article: John Wall, Samuel Lesko 📃 Read what they had to say in the full article: https://lnkd.in/gK2A6DG8

𝗧𝗵𝗮𝗻𝗸𝘀 𝗳𝗼𝗿 𝘃𝗶𝘀𝗶𝘁𝗶𝗻𝗴 𝗼𝘂𝗿 𝗯𝗼𝗼𝘁𝗵 𝗮𝘁 #𝗕𝗿𝗮𝗸𝗲𝟮𝟰! We had a great time connecting with everyone on the expo floor. Already looking forward to the next one! 📝 Stay connected with our team: Melinda Bullaro Ravi chandra Chintala Manisha Tripathy, Ph.D. #tribology #brake