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Struggling with precise overlay inspection in your semiconductor wafer manufacturing? Our advanced industrial cameras with UV and SWIR capabilities offer a reliable solution. Here's how it works: - Diffraction-based measurement: These cameras capture the light spectrum at different angles and wavelengths, allowing for precise calculation of any shifts. - UV and SWIR sensitivity: Our cameras see beyond the visible spectrum, capturing crucial details for accurate overlay assessment. - Global shutter technology: This ensures distortion-free images, even for objects in motion. Need a customized solution? No problem! The modular camera systems from can be tailored to your specific needs. Learn more about UV and SWIR cameras: https://hubs.ly/Q02KxDQX0 #semiconductor #waferinspection #industrialcameras #balluff

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