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Interesting read in Power Electronics World Magazine:  Learn how researchers from A*STAR (Agency for Science, Technology and Research Singapore) use CAMECA atom probe tomography to study SiC MOSFETs produced with alternative processes that have much promise. https://ow.ly/MFZf50SuKGl

SiC MOSFETs: Scrutinising the gate atom by atom -  News

SiC MOSFETs: Scrutinising the gate atom by atom - News

powerelectronicsworld.net

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