PillarHall metrology chips with imaging ellipsometer is a powerful tool to evaluate thin-film conformality.
CEO of AlixLabs AB & Senior Technology Analyst at TECHCET LLC CA & Adjunct Associate Professor at Linköping University
The AVS 24th International Conference on Atomic Layer Deposition (ALD 2024) is set to take place from August 4 to 7, 2024, at the Messukeskus in Helsinki, Finland. This event will bring together industry professionals, researchers, and thought leaders for a three-day conference focused on the advancements in atomic layer deposition and etching technologies. Park Systems and Chipmetrics will collaborate, showcasing their innovations at booths 28 and 29. Attendees will have the opportunity to experience the latest in imaging ellipsometry technology through live demonstrations, engage with experts for insights, and network with key figures in the field. AVS, the organizing body, is a non-profit scientific organization dedicated to fostering knowledge sharing and advancement in various scientific and technological disciplines through conferences, publications, awards, and career services. #ALDep #ALDALE2024 #Helsinki #Finland Mikko Utriainen Feng Gao https://lnkd.in/edRujAQc