Romain Bourrellier’s Post

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/qpF4fV Watch the video on youtube: 🌐 https://okt.to/frh0F1 #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/jbW4Mw Watch the video on youtube: 🌐 https://okt.to/eliXLa #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/JwAY7P Watch the video on youtube: 🌐 https://okt.to/MCpGmu #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/90cOCz Watch the video on youtube: 🌐 https://okt.to/zW3Gph #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

As devices become increasingly miniaturized, precise local characterization of thin films is essential. Ellipsometry, with its non-contact, high-resolution capabilities, is vital for measuring film thickness and refractive indices down to 1 angstrom. The Accurion EP4 Imaging Spectroscopic Ellipsometer advances these capabilities by integrating ellipsometry with optical microscopy. It delivers 0.01 nm vertical and 1 µm lateral resolution, enabling comprehensive 2D imaging and the simultaneous measurement of over 300,000 points. This allows for detailed analysis of micron-sized features and local variations. The EP4 supports a wide range of applications, including 2D material characterization, photonics, semiconductor wafer quality control, and battery research. To learn more about the details of Accurion EP4: 🌐 https://okt.to/IV6u8s Watch the video on youtube: 🌐 https://okt.to/YSFODy #ThinFilm #ImagingSpectroscopicEllipsometry #AccurionEP4 #Nanotechnology #Research

A classical way to image nanoscale structures in cells is with high-powered, expensive super-resolution microscopes. As an alternative, Massachusetts Institute of Technology researchers have developed a way to expand tissue before imaging it — a technique that allows them to achieve nanoscale resolution with a conventional light microscope: https://bit.ly/3YwyS0a

Compact fs laser for two AND three photon imaging! Femtosecond lasers around 1µm are well known for two photon imaging. But did you know that HÜBNER Photonics is offering a solution for simulatanous two and three photon imaging? Due to an unique femtosecond laser technology we are able to extend the wavelength range compared to a typical femtosecond laser. Why is it important? SHG allows for imaging of e.g. collagen fibers. Now you can do more! THG signals can provide detailed imaging of interfaces, lipid-rich structures, and regions of high optical heterogeneity, such as cell membranes and organelle boundaries. Take the chance to talk to our colleagues at BIOS in San Francisco and learn how easy it could be to get more information from your probes! BIOS booth 6461 #Laser #Ultrafast #cancertreatment

SuperLight Photonics Unveils Next Era of Wideband Laser Innovation at SPIE Photonics West, Booth 5310-A Better Light | More Insight SuperLight Photonics is a leading innovator in the photonics industry, specializing in cutting-edge supercontinuum laser technologies. With a focus on applications such as Optical Coherence Tomography, Metrology, Spectroscopy/Spectral Imaging and Microscopy for a wide variety of markets and use cases, SuperLight Photonics is at the forefront of creating transformative Photonic-IC (PIC) based solutions.

Soft/hard differentiation of surface features at the nanoscale! I've been working on #biomaterials surfaces recently with the #afm and got nice information from phase imaging. One of the unique features of AFM is that it can give you nano-mechanical information about a surface, the easiest being the phase image. You get an immediate idea of what's on your surface and it's particularly useful for co-polymers of different stiffness. https://lnkd.in/ei8erwjq

The design of the LVEM 25E is now protected under European Patent No. 4364179. This milestone highlights our commitment to innovation in electron microscopy. The project Invention application: Multi-mode low voltage electron microscope was proudly co-funded by the European Union, supporting the development of cutting-edge imaging technology. #enjoyLVEM #ElectronMicroscopy #Innovation #EuropeanPatent